Works matching DE "AVALANCHE photodiodes"
1
- Laser & Photonics Reviews, 2025, v. 19, n. 13, p. 1, doi. 10.1002/lpor.202401804
- Liu, Feng;
- Farmer, James;
- Faulkner, Grahame;
- McKendry, Jonathan J. D.;
- Xie, Enyuan;
- Zheng, Qianfang;
- Wang, Zhaoming;
- Wang, Jianming;
- Hill, Jordan;
- Herrnsdorf, Johannes;
- Dawson, Martin D.;
- O'Brien, Dominic
- Article
2
- Instruments & Experimental Techniques, 2025, v. 68, n. 2, p. 253, doi. 10.1134/S0020441225700435
- Article
3
- Journal of Optical Communications, 2025, v. 46, n. 3, p. 497, doi. 10.1515/joc-2024-0099
- Gopalan, Anitha;
- Arulmozhi, Arumugam Krishnan;
- Pandian, Manimaraboopathy Maruthu;
- Mohanadoss, Priscilla;
- Dorairajan, Nithya;
- Balaji, Morasa;
- Taher, Aziz Mahoumd
- Article
4
- Particles (2571-712X), 2025, v. 8, n. 2, p. 50, doi. 10.3390/particles8020050
- Article
5
- Particles (2571-712X), 2025, v. 8, n. 2, p. 36, doi. 10.3390/particles8020036
- Article
6
- European Radiology, 2012, v. 22, n. 8, p. 1776, doi. 10.1007/s00330-012-2415-4
- Kolb, Armin;
- Wehrl, Hans;
- Hofmann, Matthias;
- Judenhofer, Martin;
- Eriksson, Lars;
- Ladebeck, Ralf;
- Lichy, Matthias;
- Byars, Larry;
- Michel, Christian;
- Schlemmer, Heinz-Peter;
- Schmand, Matthias;
- Claussen, Claus;
- Sossi, Vesna;
- Pichler, Bernd
- Article
7
- Measurement Techniques, 2019, v. 61, n. 12, p. 1166, doi. 10.1007/s11018-019-01565-6
- Gostev, P. P.;
- Agapov, D. P.;
- Demin, A. V.;
- Levin, G. G.;
- Mamonov, E. A.;
- Magnitsky, S. A.
- Article
8
- Instruments (2410-390X), 2022, v. 6, n. 3, p. N.PAG, doi. 10.3390/instruments6030029
- Article
9
- Instruments (2410-390X), 2021, v. 5, n. 2, p. 1, doi. 10.3390/instruments5020020
- Duranti, Matteo;
- Vagelli, Valerio;
- Ambrosi, Giovanni;
- Barbanera, Mattia;
- Bertucci, Bruna;
- Catanzani, Enrico;
- Donnini, Federico;
- Faldi, Francesco;
- Formato, Valerio;
- Graziani, Maura;
- Ionica, Maria;
- Moriconi, Lucio;
- Oliva, Alberto;
- Serpolla, Andrea;
- Silvestre, Gianluigi;
- Tost, Luca
- Article
10
- Electronics (2079-9292), 2022, v. 11, n. 5, p. 802, doi. 10.3390/electronics11050802
- Choi, Hyejeong;
- Park, Chan-Yong;
- Baek, Soo-Hyun;
- Moon, Gap Yeal;
- Yun, Ilgu
- Article
11
- Electronics (2079-9292), 2021, v. 10, n. 22, p. 2731, doi. 10.3390/electronics10222731
- Mahmoudi, Hiwa;
- Zimmermann, Horst
- Article
12
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-024-84730-4
- Liu, Chen;
- Ye, Haifeng;
- Zhao, Weilin;
- Bai, Rong;
- Shi, Yanli
- Article
13
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 222, n. 8, p. 1, doi. 10.1002/pssa.202400538
- Jeong, Hoon;
- Cho, Minkyu;
- Xu, Zhiyu;
- Mehnke, Frank;
- Shen, Shyh‐Chiang;
- Detchprohm, Theeradetch;
- Dupuis, Russell D.;
- Otte, Adam Nepomuk
- Article
14
- Physica Status Solidi. A: Applications & Materials Science, 2024, v. 221, n. 13, p. 1, doi. 10.1002/pssa.202300648
- Gnanamani, Risab;
- Bertin, Hervé;
- Besancon, Claire;
- Mekhazni, Karim;
- Caillaud, Christophe;
- Deng, Marina;
- Mukherjee, Chhandak;
- Maneux, Cristell
- Article
15
- Physica Status Solidi. A: Applications & Materials Science, 2024, v. 221, n. 3, p. 1, doi. 10.1002/pssa.202300490
- Sun, Zhaolan;
- Yang, Jing;
- Zhao, Degang;
- Liu, Bing;
- Yang, Qian;
- Liu, Zongshun;
- Duan, Lihong;
- Liang, Feng;
- Zheng, Fu;
- Liu, Xuefeng
- Article
16
- Physica Status Solidi. A: Applications & Materials Science, 2023, v. 220, n. 5, p. 1, doi. 10.1002/pssa.202200636
- Adachi, Yusuke;
- Kobayashi, Taizo
- Article
17
- Bulletin of the Polish Academy of Sciences: Technical Sciences, 2024, v. 72, n. 3, p. 1, doi. 10.24425/bpasts.2024.149173
- MANYK, Tetiana;
- SOBIESKI, Jan;
- MATUSZELAŃSKI, Kacper;
- RUTKOWSKI, Jarosław;
- MARTYNIUK, Piotr
- Article
18
- Remote Sensing, 2022, v. 14, n. 21, p. 5304, doi. 10.3390/rs14215304
- Chang, Jiying;
- Li, Jining;
- Chen, Kai;
- Liu, Shuai;
- Wang, Yuye;
- Zhong, Kai;
- Xu, Degang;
- Yao, Jianquan
- Article
19
- International Journal of High Speed Electronics & Systems, 2006, v. 16, n. 2, p. 567, doi. 10.1142/S0129156406003850
- Abedin, M. Nurul;
- Refaat, Tamer F.;
- Sulima, Oleg V.;
- Singh, Upendra N.
- Article
20
- Journal of Sensors, 2008, p. 1, doi. 10.1155/2008/782764
- Constandinou, Timothy G.;
- Georgiou, Julius
- Article
21
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 5829, doi. 10.1007/s11664-024-11200-y
- Rothman, Johan;
- Abergel, Julie;
- Coquiard, Antoine;
- Gout, Sylvain;
- Lonjon, Maxime;
- Montel, Anaëlle;
- Lechevallier, Loïc;
- Ferron, Alexandre;
- Mavel, Amaury;
- Bustillos-Vasco, Samantha;
- Renet, Sebastien;
- Berger, Frederic;
- Vandeneynde, Aurelie;
- Brunet-Manquat, Sandy
- Article
22
- Journal of Electronic Materials, 2021, v. 50, n. 9, p. 5259, doi. 10.1007/s11664-021-09044-x
- Cheang, Pei Ling;
- Wong, Eng Kiong;
- Teo, Lay Lian
- Article
23
- Journal of Electronic Materials, 2021, v. 50, n. 8, p. 4462, doi. 10.1007/s11664-021-08981-x
- Bakhtiary-Noodeh, Marzieh;
- Cho, Minkyu;
- Jeong, Hoon;
- Xu, Zhiyu;
- Tsou, Chuan-Wei;
- Cao, Can;
- Shen, Shyh-Chiang;
- Detchprohm, Theeradetch;
- Dupuis, Russell D.
- Article
24
- Electronics Letters (Wiley-Blackwell), 2023, v. 59, n. 18, p. 1, doi. 10.1049/ell2.12956
- Cao, Peng;
- Peng, Hongling;
- Wang, Tiancai;
- Srivastava, Vibha;
- Kesaria, Manoj;
- You, Minghui;
- Zhuang, Qiandong;
- Zheng, Wanhua
- Article
25
- Electronics Letters (Wiley-Blackwell), 2020, v. 56, n. 17, p. 854, doi. 10.1049/el.2020.2184
- Article
26
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 18, p. 1004, doi. 10.1049/el.2019.1427
- Connolly, P. W. R.;
- Ren, X.;
- Henderson, R. K.;
- Buller, G. S.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 14, p. 808, doi. 10.1049/el.2019.1242
- Belem-Goncalves, C.;
- Lacombe, E.;
- Gidel, V.;
- Durand, C.;
- Gianesello, F.;
- Gloria, D.;
- Luxey, C.;
- Ducournau, G.
- Article
28
- Communications Physics, 2025, v. 8, n. 1, p. 1, doi. 10.1038/s42005-025-02042-z
- Lenart, Arpad;
- Islam, Tanvirul;
- Sivasankaran, Srihari;
- Neilson, Peter;
- Hidding, Bernhard;
- Oi, Daniel K. L.;
- Ling, Alexander
- Article
29
- Turkish Journal of Physics, 2019, v. 43, n. 6, p. 556, doi. 10.3906/fiz-1905-16
- DOĞANCI, Emre;
- KAYA, Şenol;
- AKTAĞ, Aliekber;
- DUMAN, Elif SARIGÜL;
- TURAN, Raşit;
- KARAÇALI, Hüseyin;
- YILMAZ, Ercan
- Article
30
- Cogent Engineering, 2020, v. 7, n. 1, p. 1, doi. 10.1080/23311916.2020.1764171
- Wang, Yangqian;
- Zhang, Yuliang;
- Yang, Yang A.;
- Lu, Xing;
- Zou, Xinbo;
- Konofaos, Nikos
- Article
31
- Technical Physics Letters, 2023, v. 49, p. S215, doi. 10.1134/S1063785023900819
- Maleev, N. A.;
- Kuzmenkov, A. G.;
- Kulagina, M. M.;
- Vasyl'ev, A. P.;
- Blokhin, S. A.;
- Troshkov, S. I.;
- Nashchekin, A. V.;
- Bobrov, M. A.;
- Blokhin, A. A.;
- Voropaev, K. O.;
- Bugrov, V. E.;
- Ustinov, V. M.
- Article
32
- Technical Physics Letters, 2019, v. 45, n. 7, p. 739, doi. 10.1134/S1063785019070204
- Chizh, A. L.;
- Mikitchuk, K. B.;
- Zhuravlev, K. S.;
- Dmitriev, D. V.;
- Toropov, A. I.;
- Valisheva, N. A.;
- Aksenov, M. S.;
- Gilinsky, A. M.;
- Chistokhin, I. B.
- Article
33
- Majlesi Journal of Telecommunication Devices, 2014, v. 3, n. 2, p. 77
- Yousefli, Amir;
- Zavvari, Mahdi;
- Abedi, Kambiz
- Article
34
- Scientific Reports, 2024, v. 14, n. 1, p. 1, doi. 10.1038/s41598-024-72535-4
- Wu, Shuin Jian;
- Chowdhury, Arya;
- Soe, Moe Thar;
- Ling, Alexander
- Article
35
- Human & Experimental Toxicology, 2006, v. 25, n. 3, p. 141, doi. 10.1191/0960327106ht588oa
- Article
36
- Crystals (2073-4352), 2021, v. 11, n. 8, p. 866, doi. 10.3390/cryst11080866
- Chen, Liang;
- Wei, Zhi;
- Wang, Di;
- Liu, Hong-Xu;
- Jin, Guang-Yong
- Article
37
- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-24966-0
- Liu, Yuchen;
- Yi, Xin;
- Bailey, Nicholas J.;
- Zhou, Zhize;
- Rockett, Thomas B. O.;
- Lim, Leh W.;
- Tan, Chee H.;
- Richards, Robert D.;
- David, John P. R.
- Article
38
- Indian Journal of Public Health Research & Development, 2018, v. 9, n. 3, p. 485, doi. 10.5958/0976-5506.2018.00332.7
- Article
39
- Advances in Optical Technologies, 2012, p. 1, doi. 10.1155/2012/512902
- Guarneri, Massimiliano;
- de Collibus, Mario Ferri;
- Fornetti, Giorgio;
- Francucci, Massimo;
- Nuvoli, Marcello;
- Ricci, Roberto
- Article
40
- Nanoscale Research Letters, 2019, v. 14, n. 1, p. 1, doi. 10.1186/s11671-018-2827-4
- Cao, Siyu;
- Zhao, Yue;
- Feng, Shuai;
- Zuo, Yuhua;
- Zhang, Lichun;
- Cheng, Buwen;
- Li, Chuanbo
- Article
41
- Journal of Active & Passive Electronic Devices, 2012, v. 7, n. 4, p. 285
- Article
42
- Journal of Electronic Materials, 2020, v. 49, n. 11, p. 6881, doi. 10.1007/s11664-020-08461-8
- Rothman, Johan;
- Pes, Salvatore;
- Bleuet, Pierre;
- Abergel, Julie;
- Gout, Sylvain;
- Nicolas, Jean-Alain;
- Rostaing, Jean-Pierre;
- Renet, Sebastien;
- Mathieu, Lydie;
- Le Perchec, Jérôme
- Article
43
- Journal of Electronic Materials, 2020, v. 49, n. 8, p. 4589, doi. 10.1007/s11664-020-07970-w
- Ichikawa, Yuki;
- Tanaka, Keita;
- Nakagawa, Kazuki;
- Fujii, Yuta;
- Yoshida, Kentaro;
- Nakamura, Kaiki;
- Miyazaki, Ryuichi;
- Abe, Tomoki;
- Kasada, Hirofumi;
- Ichino, Kunio;
- Akaiwa, Kazuaki
- Article
44
- Journal of Electronic Materials, 2020, v. 49, n. 4, p. 2343, doi. 10.1007/s11664-020-07950-0
- Zhang, Zhenhua;
- Sun, Lijie;
- Chen, Meng;
- Qiu, Xinjia;
- Li, Bin;
- Jiang, Hao
- Article
45
- Journal of Electronic Materials, 2019, v. 48, n. 10, p. 6025, doi. 10.1007/s11664-019-07441-x
- Easley, Justin;
- Martin, Christopher R.;
- Ettenberg, Martin H.;
- Phillips, Jamie
- Article
46
- Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5657, doi. 10.1007/s11664-018-6475-3
- Article
47
- Journal of Electronic Materials, 2018, v. 47, n. 10, p. 5705, doi. 10.1007/s11664-018-6425-0
- Sieck, A.;
- Benecke, M.;
- Eich, D.;
- Oelmaier, R.;
- Wendler, J.;
- Figgemeier, H.
- Article
48
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4187, doi. 10.1007/s11664-015-3975-2
- Grzesik, Michael;
- Bailey, Robert;
- Mahan, Joe;
- Ampe, Jim
- Article
49
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2970, doi. 10.1007/s11664-014-3164-8
- Beck, Jeff;
- Welch, Terry;
- Mitra, Pradip;
- Reiff, Kirk;
- Sun, Xiaoli;
- Abshire, James
- Article
50
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2947, doi. 10.1007/s11664-014-3155-9
- Rothman, Johan;
- Foubert, Kevin;
- Lasfargues, Gilles;
- Largeron, Christophe
- Article