Works matching DE "AUTOMATIC test equipment"

Results: 238

The use of electroerosion for the creation of standard and alternative artificial defects in order to configure and evaluate automated nondestructive test tools.

Published in:

Metallurgist, 2025, v. 68, n. 12, p. 1828, doi. 10.1007/s11015-025-01896-6

By:

Aminov, A. B.;
Voronov, V. V.;
Bachurin, O. A.;
Nizamov, S. R.;
Ilyichev, A. V.;
Zaselsky, E. M.

Publication type:

Article

Nonparametric richness estimators Chao1 and ACE must not be used with amplicon sequence variant data.

Published in:

ISME Journal: Multidisciplinary Journal of Microbial Ecology, 2024, v. 18, n. 1, p. 1, doi. 10.1093/ismejo/wrae106

By:

Deng, Yongcui;
Umbach, Alexander K;
Neufeld, Josh D

Publication type:

Article

Editorial – RoSE to use Manuscript Central.

Published in:: 2006
Publication type:: Editorial

Rack-and-stack instruments: Often a better choice than VXI or PXI systems.

Published in:

Computing & Control Engineering, 2005, v. 16, n. 1, p. 16, doi. 10.1049/cce:20050102

By:

Cimino, Charles

Publication type:

Article

A toolset for conformance testing against UML sequence diagrams based on event-driven colored Petri nets.

Published in:

International Journal on Software Tools for Technology Transfer, 2016, v. 18, n. 3, p. 285, doi. 10.1007/s10009-014-0354-x

By:

Faria, João;
Paiva, Ana

Publication type:

Article

Testing abstract behavioral specifications.

Published in:

International Journal on Software Tools for Technology Transfer, 2015, v. 17, n. 1, p. 107, doi. 10.1007/s10009-014-0301-x

By:

Wong, Peter;
Bubel, Richard;
Boer, Frank;
Gómez-Zamalloa, Miguel;
Gouw, Stijn;
Hähnle, Reiner;
Meinke, Karl;
Sindhu, Muddassar

Publication type:

Article

More testable properties.

Published in:

International Journal on Software Tools for Technology Transfer, 2012, v. 14, n. 4, p. 407, doi. 10.1007/s10009-011-0220-z

By:

Falcone, Yliès;
Fernandez, Jean-Claude;
Jéron, Thierry;
Marchand, Hervé;
Mounier, Laurent

Publication type:

Article

A Compensation-Type Pyrometer.

Published in:

Measurement Techniques, 2014, v. 57, n. 6, p. 679, doi. 10.1007/s11018-014-0518-9

By:

Zakharenko, V.;
Klikushin, Yu.;
Ponomarev, D.

Publication type:

Article

Compaction of test response at self-testing in the programmable logic matrices.

Published in:

Automation & Remote Control, 2013, v. 74, n. 2, p. 264, doi. 10.1134/S0005117913020082

By:

Aksenova, G.

Publication type:

Article

基于优化 BPNN 的 FPGA 内嵌高速接口总抖动预测方法.

Published in:

Electronic Science & Technology, 2025, v. 38, n. 2, p. 70, doi. 10.16180/j.cnki.issn1007-7820.2025.02.009

By:

叶翔宇;
林晓会;
丁江乔;
解维坤

Publication type:

Article

Control System Design of Transmission Test Bench.

Published in:: Construction Machinery & Equipment, 2020, v. 51, n. 8, p. 1
Publication type:: Article

Design and Implementation of an Integrated Avionics Test System for General Aircraft.

Published in:

Telecommunication Engineering, 2015, v. 55, n. 4, p. 419, doi. 10.3969/j.issn.1001-893x.2015.04.012

By:

DUAN Rongyi;
WANG Haibin;
YANG Jiang;
LIU Ying

Publication type:

Article

PREDICTIVE MAINTENANCE OF THE AUTOMATED SEWING MACHINES IN TEXTILE INDUSTRY.

Published in:

Annals of the University of Oradea. Fascicle of Textiles, Leatherwork, 2019, v. 20, n. 2, p. 103

By:

Marius Darius, ŞUTEU;
Calin Florin, BABAN;
Marius, BABAN;
George, DRAGOMIR;
(Kiss) Edit, TOTH

Publication type:

Article

GAN augmented phase noise modeling of PLL for use in automated testing.

Published in:

International Journal of Electronics Letters, 2025, v. 13, n. 2, p. 219, doi. 10.1080/21681724.2025.2453916

By:

Panigrahi, Jayanta Kumar;
Acharya, Debiprasad Priyabrata

Publication type:

Article

Encoding Test Pattern of System-on-Chip (SOC) Using Annular Scan Chain.

Published in:

Security & Communication Networks, 2022, p. 1, doi. 10.1155/2022/6974101

By:

Huang, Guilin;
Zhang, Zhengjin;
Wang, Honghai;
Jiang, Jiabao;
Wu, Qilin

Publication type:

Article

DEVELOPMENT OF AUTOMATED TEST MEASUREMENT SYSTEM FOR DETERMINING LOW PASS FILTER CUT-OFF FREQUENCY.

Published in:

Acta Technica Corviniensis - Bulletin of Engineering, 2016, v. 9, n. 3, p. 113

By:

IBRAHIM, Oladimeji;
AKOREDE, Mudathir Funsho

Publication type:

Article

Influence of Vegetarian and Nonvegetarian Diets on hs-CRP Levels, Lipid Profiles, and Cardiovascular Health in Adults.

Published in:

Journal of Pharmacy & Bioallied Sciences, 2025, v. 17, p. S284, doi. 10.4103/jpbs.jpbs_470_25

By:

Chakole, Sunil;
Anjankar, Namrata;
Anjankar, Ashish;
Narkhede, Harshal;
Mahajan, Sanket

Publication type:

Article

Reducing the Length of the Test Sequence for Analog Test Signal Generation.

Published in:

Electrotechnical Review / Elektrotehniski Vestnik, 2015, v. 82, n. 1/2, p. 8

By:

Ting Long;
Jiang Shiqi;
Xu Lijia

Publication type:

Article

The Handbook of Automated Essay Evaluation: Current Applications and New Directions.

Published in:

2015

By:

Han, Sumi

Publication type:

Book Review

Reinforcement learning-based joint self-optimisation method for the fuzzy logic handover algorithm in 5G HetNets.

Published in:

Neural Computing & Applications, 2023, v. 35, n. 10, p. 7297, doi. 10.1007/s00521-021-06673-5

By:

Liu, Qianyu;
Kwong, Chiew Foong;
Wei, Sun;
Zhou, Sijia;
Li, Lincan;
Kar, Pushpendu

Publication type:

Article

Addressing New Requirements for Legacy Test Stations.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 16

By:

Hansen, Peter

Publication type:

Article

Reducing Defect Rates With Cell-Aware Testing.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 26

By:

Hapke, Friedrich;
Reese, Michael;
Rivers, Jason

Publication type:

Article

Modular Instruments Address 802.1 lac.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 6, p. 32

By:

Nelson, Rick

Publication type:

Article

Protocol-Aware ATE Digital Instruments.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 5, p. 36

By:

Aslanian, John

Publication type:

Article

Modular Market Drives a Disruptive Change.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 5, p. 32

By:

Desjardin, Larry

Publication type:

Article

The Progression of MIL/Aero Test Systems.

Published in:

EE: Evaluation Engineering, 2012, v. 51, n. 2, p. 8

By:

Lecklider, Tom

Publication type:

Article

Exploring VXI 4.0.

Published in:

2011

By:

Sarfi, Tom;
Greenberg, Charles;
Bloennigen, Fred

Publication type:

Product Review

Runtime-Defined Instruments Tackle Modern Bus Designs.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 9, p. 14

By:

Hansen, Peter

Publication type:

Article

Combining Logic BIST and Scan Test Compression.

Published in:

EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 28

By:

Guettaf, Amer

Publication type:

Article

See You in Orlando.

Published in:

2010

By:

Milo, Paul

Publication type:

Proceeding

Using ATE for Efficient DigRF Interface Testing.

Published in:

EE: Evaluation Engineering, 2008, v. 47, n. 9, p. 30

By:

Lathrop, Richard

Publication type:

Article

Driving Test Cost Reduction For Next-Generation RF Devices.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 12, p. 18

By:

Harvey, Ken

Publication type:

Article

Applying Kelvin Measurements To PMIC Testing on ATE.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 32

By:

Luehman, Kent

Publication type:

Article

Next-Generation RF Device Test Performance Challenges.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 20

By:

Harvey, Ken

Publication type:

Article

Embedded Compression For Production Test.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 10, p. 30

By:

Press, Ron

Publication type:

Article

Next-Generation RF Devices Impact Test.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 10, p. 12

By:

Harvey, Ken

Publication type:

Article

Testing Challenges of a Multicore Microprocessor.

Published in:

EE: Evaluation Engineering, 2007, v. 46, n. 2, p. 12

By:

Bushard, Louis;
Chelstrom, Nathan;
Ferguson, Steven;
Keller, Brion

Publication type:

Article

ATE Implementations for Multisite Device Test.

Published in:

EE: Evaluation Engineering, 2005, v. 44, n. 7, p. 18

By:

Kramer, Randy;
Proskauer, Dan

Publication type:

Article

Test Pattern Compression Saves Time and Bits.

Published in:

EE: Evaluation Engineering, 2005, v. 44, n. 7, p. 32

By:

Lecklider, Tom

Publication type:

Article

ATML-A New Standard for ATE.

Published in:

EE: Evaluation Engineering, 2005, v. 44, n. 3, p. 12

By:

Harrison, Ron

Publication type:

Article

The Future of High-Speed ATE.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 11, p. 32

By:

Leichtle, Clemens

Publication type:

Article

ATE for SOC Multisite Testing.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 7, p. 18

By:

Kramer, Randy

Publication type:

Article

Accurate Test Without ATE-Generated Vectors.

Published in:

EE: Evaluation Engineering, 2004, v. 43, n. 6, p. 28

By:

Lecklider, Tom

Publication type:

Article

A smart process controller framework for Industry 4.0 settings.

Published in:

2021

By:

Cohen, Yuval;
Singer, Gonen

Publication type:

Editorial

Editorial.

Published in:

2019

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Editorial.

Published in:

2019

By:

Agrawal, Vishwani D.

Publication type:

Editorial

Editorial.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 2, p. 105, doi. 10.1007/s10836-018-5728-7

By:

Agrawal, Vishwani D.

Publication type:

Article

Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 2, p. 147, doi. 10.1007/s10836-018-5721-1

By:

Terao, Naoki;
Nakura, Toru;
Ishida, Masahiro;
Ikeno, Rimon;
Kusaka, Takashi;
Iizuka, Tetsuya;
Asada, Kunihiro

Publication type:

Article

Automation of Test Program Synthesis for Processor Post-silicon Validation.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 1, p. 83, doi. 10.1007/s10836-018-5709-x

By:

Suryasarman, Vasudevan Madampu;
Biswas, Santosh;
Sahu, Aryabartta

Publication type:

Article

A Low Power Online Test Method for FPGA Single Solder Joint Resistance.

Published in:

Journal of Electronic Testing, 2017, v. 33, n. 6, p. 775, doi. 10.1007/s10836-017-5698-1

By:

Wang, Nantian;
Ma, Xiaoyu;
Xu, Xiaobin;
Rui, Ziqiao

Publication type:

Article