Works matching DE "AUTOMATIC control of light emitting diodes"

Automatic inspection system of LED chip using two-stages back-propagation neural network.

Published in:

Journal of Intelligent Manufacturing, 2014, v. 25, n. 6, p. 1235, doi. 10.1007/s10845-012-0725-7

By:

• Kuo, Chung-Feng;
• Hsu, Chien-Tung;
• Liu, Zong-Xian;
• Wu, Han-Cheng

Publication type:

Article