Works matching DE "ATOMIC force microscope noise"

Improving AFM Images with Harmonic Interference by Spectral Analysis.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 1, p. 186, doi. 10.1017/S1431927611012281

By:

• Kiwilszo, Marek;
• Zieliński, Artur;
• Smulko, Janusz;
• Darowicki, Kazimierz

Publication type:

Article