Works matching DE "ASM International"
1
- Solid State Technology, 2001, v. 44, n. 3, p. 46
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2
- Solid State Technology, 2001, v. 44, n. 1, p. 70
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3
- Solid State Technology, 2000, v. 43, n. 11, p. 135
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4
- Solid State Technology, 2000, v. 43, n. 5, p. 20
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5
- Solid State Technology, 2000, v. 43, n. 4, p. 20
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6
- Solid State Technology, 1999, v. 42, n. 12, p. 24
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7
- Solid State Technology, 1999, v. 42, n. 11, p. 18
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8
- Solid State Technology, 1999, v. 42, n. 10, p. 20
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9
- Solid State Technology, 1999, v. 42, n. 10, p. 20
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10
- Solid State Technology, 1999, v. 42, n. 5, p. 18
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11
- Solid State Technology, 1998, v. 41, n. 5, p. 48
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12
- Chemical Industry / Hemijska Industrija, 2021, v. 75, n. 4, p. 195
- Petrović, Jasmina Lj.;
- Mladenović, Srba A.;
- Ivanović, Aleksandra T.;
- Marković, Ivana I.;
- Ivanov, Svetlana Lj.
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13
- Transactions of the Institute of Metal Finishing, 2023, v. 101, n. 1, p. 4, doi. 10.1080/00202967.2022.2149687
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14
- Journal of Thermal Spray Technology, 2011, v. 20, n. 5, p. 975, doi. 10.1007/s11666-011-9678-1
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15
- 2008
- Question & Answer
16
- Tribology & Lubrication Technology, 2012, v. 68, n. 10, p. 6
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17
- Tribology & Lubrication Technology, 2011, v. 67, n. 12, p. 4
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18
- Science Teacher, 2019, v. 86, n. 7, p. 10
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19
- Science Teacher, 2019, v. 86, n. 6, p. 14
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20
- ASM Business Review, 2018, v. 7, n. 1, p. iii
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21
- Journal of Mammalogy, 2018, v. 99, n. 5, p. 1277, doi. 10.1093/jmammal/gyy125
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22
- Electronic Device Failure Analysis, 2019, v. 21, n. 2, p. 49
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24
- Electronic Device Failure Analysis, 2019, v. 21, n. 1, p. 47
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25
- Electronic Device Failure Analysis, 2019, v. 21, n. 1, p. 47
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26
- Electronic Device Failure Analysis, 2019, v. 21, n. 1, p. 46
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27
- Electronic Device Failure Analysis, 2018, v. 20, n. 4, p. 61
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29
- Electronic Device Failure Analysis, 2018, v. 20, n. 1, p. 42
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31
- Electronic Device Failure Analysis, 2018, v. 20, n. 1, p. 42
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32
- Electronic Device Failure Analysis, 2017, v. 19, n. 2, p. 35
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33
- Electronic Device Failure Analysis, 2017, v. 19, n. 1, p. 25
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34
- Electronic Device Failure Analysis, 2015, v. 17, n. 1, p. 38
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35
- Electronic Device Failure Analysis, 2014, v. 16, n. 1, p. 46
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39
- Electronic Device Failure Analysis, 2009, v. 11, n. 2, p. 22
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40
- Electronic Device Failure Analysis, 2008, v. 10, n. 3, p. 41
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41
- Journal of Failure Analysis & Prevention, 2023, v. 23, n. 6, p. 2344, doi. 10.1007/s11668-023-01774-w
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42
- 2020
- Aklilu, Getahun;
- Bright, Glen;
- Adali, Sarp
- Correction Notice
43
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 4, p. 656, doi. 10.1007/s11668-017-0315-2
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44
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 4, p. 650, doi. 10.1007/s11668-017-0317-0
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45
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 4, p. 654, doi. 10.1007/s11668-017-0318-z
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46
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 3, p. 412, doi. 10.1007/s11668-017-0274-7
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47
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 3, p. 411, doi. 10.1007/s11668-017-0276-5
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48
- Journal of Failure Analysis & Prevention, 2017, v. 17, n. 1, p. 50, doi. 10.1007/s11668-016-0227-6
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49
- Journal of Failure Analysis & Prevention, 2016, v. 16, n. 4, p. 548, doi. 10.1007/s11668-016-0139-5
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50
- Journal of Failure Analysis & Prevention, 2016, v. 16, n. 1, p. 42, doi. 10.1007/s11668-015-0061-2
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