Works about ANALOG electronic systems
1
- Natural Computing, 2008, v. 7, n. 4, p. 485
- Miguel Gutiérrez-Naranjo;
- Mario Pérez-Jiménez;
- Daniel RamÃrez-MartÃnez
- Article
2
- Journal of Visual Culture, 2014, v. 13, n. 2, p. 118, doi. 10.1177/1470412914529110
- Sterne, Jonathan;
- Mulvin, Dylan
- Article
3
- Measurement Techniques, 2015, v. 58, n. 1, p. 59, doi. 10.1007/s11018-015-0663-9
- Bezdenezhnykh, S.;
- Kaminskii, O.;
- Stal'nova, K.
- Article
4
- Measurement Techniques, 2012, v. 55, n. 6, p. 676, doi. 10.1007/s11018-012-0020-1
- Zalutskaya, T.;
- Likhnovsky, I.;
- Lutsyk, Ya.
- Article
5
- Measurement Techniques, 2008, v. 51, n. 3, p. 290, doi. 10.1007/s11018-008-9031-3
- Article
6
- Measurement Techniques, 2007, v. 50, n. 8, p. 846, doi. 10.1007/s11018-007-0160-x
- Article
7
- Measurement Techniques, 2007, v. 50, n. 8, p. 817, doi. 10.1007/s11018-007-0155-7
- V. Alekhnovich;
- A. Martynov;
- A. Perchik;
- G. Utkin
- Article
8
- Mathematics (2227-7390), 2022, v. 10, n. 24, p. 4717, doi. 10.3390/math10244717
- Fortuna, Luigi;
- Buscarino, Arturo
- Article
9
- Australian Primary Mathematics Classroom, 2005, v. 10, n. 2, p. 15
- Gorham, Gail;
- Bobis, Janette
- Article
10
- Journal of Nanotechnology, 2011, p. 1, doi. 10.1155/2011/823680
- Guiru Gu;
- Yunfeng Ling;
- Runyu Liu;
- Vasinajindakaw, Puminun;
- Xuejun Lu;
- Jones, Carissa S.;
- Wu-Sheng Shih;
- Kayastha, Vijaya;
- Downing, Nick L.;
- Xuliang Han;
- Subbaraman, Harish;
- Pham, Dan;
- Chen, Ray T.;
- Maggie Yihong Chen;
- Berger, Urs;
- Renn, Mike
- Article
11
- International Journal of High Speed Electronics & Systems, 2005, v. 15, n. 2, p. 23, doi. 10.1142/S012915640500320X
- Gharpurey, Ranjit;
- Naraghi, Shahrzad
- Article
12
- Journal of Sensors, 2010, p. 1, doi. 10.1155/2010/434863
- Marani, Roberto;
- Gelao, Gennaro;
- Perri, Anna Gina
- Article
13
- Technical Gazette / Tehnički Vjesnik, 2014, v. 21, n. 4, p. 881
- Petrović, Mile;
- Jakšić, Branimir;
- Spalević, Petar;
- Milošević, Ivana;
- Lazić, Ljubomir
- Article
14
- Technical Gazette / Tehnički Vjesnik, 2014, v. 21, n. 4, p. 897
- Jalil, Jubayer;
- Ibne Reaz, Mamun Bin;
- Mahalingam, Savisha;
- Zainal Abidin, Syarizal Bin;
- Tae Gyu Chang
- Article
15
- Psychophysiology, 1975, v. 12, n. 4, p. 471, doi. 10.1111/j.1469-8986.1975.tb00028.x
- Sharp, Frank H.;
- Smith, Glenn W.;
- Sùrwillo, Walter W.
- Article
16
- CEE: Chemical Engineering Education, 2006, v. 40, n. 1, p. 40
- Panjapornpon, Chanin;
- Fletcher, Nathan;
- Soroush, Masoud
- Article
17
- International Journal of Advanced Manufacturing Technology, 2008, v. 38, n. 11/12, p. 1098, doi. 10.1007/s00170-007-1182-x
- Das, Ankur;
- Caprihan, Rahul
- Article
18
- Biology & Fertility of Soils, 2008, v. 44, n. 8, p. 1043, doi. 10.1007/s00374-008-0300-8
- K. Lorenz;
- R. Lal;
- M. Shipitalo
- Article
19
- Biology & Fertility of Soils, 2007, v. 44, n. 1, p. 187, doi. 10.1007/s00374-007-0194-x
- Ming-Xing Shen;
- Lin-Zhang Yang;
- Yue-Ming Yao;
- Dong-Dong Wu;
- Jianguo Wang;
- Ruli Guo;
- Shixue Yin
- Article
20
- Climatic Change, 2011, v. 106, n. 2, p. 315, doi. 10.1007/s10584-010-9903-9
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 24, p. 1366, doi. 10.1049/el.2018.6779
- Payandehnia, P.;
- Maghami, H.;
- Mirzaie, H.;
- Temes, G. C.
- Article
22
- Management Science, 1966, v. 12, n. 6, p. B-245, doi. 10.1287/mnsc.12.6.B245
- Eilon, Samuel;
- Deziel, D. P.
- Article
23
- VIEW: Journal of European Television History & Culture, 2013, v. 2, n. 4, p. 3, doi. 10.18146/2213-0969.2013.jethc040
- Article
24
- Computer Music Journal, 2024, v. 48, n. 1, p. 4, doi. 10.1162/comj_e_00717
- Article
25
- Computer Music Journal, 2010, v. 34, n. 1, p. 28, doi. 10.1162/comj.2010.34.1.28
- Lazzarini, Victor;
- Timoney, Joseph
- Article
26
- Al-Rafadain Engineering Journal, 2013, v. 21, n. 1, p. 77
- Khuder, A I.;
- Husain, Sh H.
- Article
27
- Symmetry (20738994), 2020, v. 12, n. 11, p. 1901, doi. 10.3390/sym12111901
- Article
28
- Journal of Microscopy, 1998, v. 191, n. 3, p. 297, doi. 10.1046/j.1365-2818.1998.00380.x
- Article
29
- EE: Evaluation Engineering, 2013, v. 52, n. 6, p. 8
- Article
30
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 34
- Albee, Alan;
- Smith, Michael J.
- Article
31
- EE: Evaluation Engineering, 2008, v. 47, n. 4, p. 41
- Hansen, Peter;
- Heide, Carl
- Article
32
- EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 44
- Article
33
- EE: Evaluation Engineering, 2006, v. 45, n. 11, p. 26
- Holder, Steve;
- Bullard, Dan
- Article
34
- EE: Evaluation Engineering, 2006, v. 45, n. 8, p. 39
- Article
35
- Teoria y Realidad Constitucional, 2010, n. 25, p. 589
- Article
36
- Electronics & Electrical Engineering, 2009, n. 96, p. 39
- Article
37
- Electronics & Electrical Engineering, 2008, n. 84, p. 97
- Article
38
- Electronics & Electrical Engineering, 2008, n. 83, p. 89
- Article
39
- Electronics & Electrical Engineering, 2007, n. 77, p. 57
- Article
40
- Electronics & Electrical Engineering, 2007, n. 77, p. 29
- Marcinkevičius, A. J.;
- Jasonis, V.;
- Poviliauskas, D.
- Article
41
- Behavior Research Methods, 2009, v. 41, n. 2, p. 446, doi. 10.3758/BRM.41.2.446
- FARRIMOND, JONATHAN A.;
- HILL, ANDREW J.;
- JONES, NICHOLAS A.;
- STEPHENS, GARY J.;
- WHALLEY, BENJAMIN J.;
- WILLIAMS, CLAIRE M.
- Article
42
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 291, doi. 10.1007/s10836-015-5523-7
- Wang, Li;
- Guo, Lianping;
- Jiang, Jun;
- Qiu, Duyu
- Article
43
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 243, doi. 10.1007/s10836-014-5445-9
- Xie, Yongle;
- Li, Xifeng;
- Xie, Sanshan;
- Xie, Xuan;
- Zhou, Qizhong
- Article
44
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 715, doi. 10.1007/s10836-013-5407-7
- Article
45
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 555, doi. 10.1007/s10836-013-5382-z
- Ao, Yongcai;
- Shi, Yibing;
- Zhang, Wei;
- Li, Yanjun
- Article
46
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 567, doi. 10.1007/s10836-013-5383-y
- Li, Min;
- Xian, Weiming;
- Long, Bing;
- Wang, Houjun
- Article
47
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 95, doi. 10.1007/s10836-012-5342-z
- Han, Han;
- Wang, Houjun;
- Tian, Shulin;
- Zhang, Na
- Article
48
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 115, doi. 10.1007/s10836-012-5344-x
- Article
49
- 2012
- Kavithamani, A.;
- Manikandan, V.;
- Devarajan, N.
- Letter
50
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 305, doi. 10.1007/s10836-010-5192-5
- Barragán, Manuel J.;
- Vázquez, Diego;
- Rueda, Adoración
- Article