Works matching DE "ANALOG electronic systems"
1
- CEE: Chemical Engineering Education, 2006, v. 40, n. 1, p. 40
- Panjapornpon, Chanin;
- Fletcher, Nathan;
- Soroush, Masoud
- Article
2
- Electronics Systems & Software, 2005, v. 3, n. 5, p. 42, doi. 10.1049/ess:20050507
- Article
3
- Electronics Systems & Software, 2005, v. 3, n. 3, p. 8
- Article
4
- Computing & Control Engineering, 2005, v. 16, n. 3, p. 6, doi. 10.1049/cce:20050310
- Article
5
- Natural Computing, 2008, v. 7, n. 4, p. 485
- Miguel Gutiérrez-Naranjo;
- Mario Pérez-Jiménez;
- Daniel RamÃrez-MartÃnez
- Article
6
- Measurement Techniques, 2015, v. 58, n. 1, p. 59, doi. 10.1007/s11018-015-0663-9
- Bezdenezhnykh, S.;
- Kaminskii, O.;
- Stal'nova, K.
- Article
7
- Measurement Techniques, 2012, v. 55, n. 6, p. 676, doi. 10.1007/s11018-012-0020-1
- Zalutskaya, T.;
- Likhnovsky, I.;
- Lutsyk, Ya.
- Article
8
- Measurement Techniques, 2008, v. 51, n. 3, p. 290, doi. 10.1007/s11018-008-9031-3
- Article
9
- Measurement Techniques, 2007, v. 50, n. 8, p. 846, doi. 10.1007/s11018-007-0160-x
- Article
10
- Measurement Techniques, 2007, v. 50, n. 8, p. 817, doi. 10.1007/s11018-007-0155-7
- V. Alekhnovich;
- A. Martynov;
- A. Perchik;
- G. Utkin
- Article
11
- Automation & Remote Control, 2014, v. 75, n. 11, p. 2086, doi. 10.1134/S0005117914110174
- Vas'kov, Yu.;
- Emel'yanov, G.
- Article
12
- Chips, 2023, v. 2, n. 1, p. 1, doi. 10.3390/chips2010001
- Rodovalho, Luís Henrique;
- Toledo, Pedro;
- Mir, Farzad;
- Ebrahimi, Farshad
- Article
13
- Chips, 2023, v. 2, n. 1, p. 20, doi. 10.3390/chips2010002
- Russo, Nicola;
- Huang, Haochun;
- Donati, Eugenio;
- Madsen, Thomas;
- Nikolic, Konstantin
- Article
14
- Issues in Science & Technology, 2005, v. 21, n. 2, p. 33
- Article
16
- VIEW: Journal of European Television History & Culture, 2013, v. 2, n. 4, p. 3, doi. 10.18146/2213-0969.2013.jethc040
- Article
17
- Journal of Experimental Botany, 2017, v. 68, n. 12, p. 3037, doi. 10.1093/jxb/erx229
- Article
18
- Al-Rafadain Engineering Journal, 2013, v. 21, n. 1, p. 77
- Khuder, A I.;
- Husain, Sh H.
- Article
19
- Electrotechnical Review / Elektrotehniski Vestnik, 2015, v. 82, n. 1/2, p. 8
- Ting Long;
- Jiang Shiqi;
- Xu Lijia
- Article
20
- Journal of the Atmospheric Sciences, 1998, v. 55, n. 3, p. 465, doi. 10.1175/1520-0469(1998)055<0465:AAARTS>2.0.CO;2
- Article
21
- Journal of Nanotechnology, 2011, p. 1, doi. 10.1155/2011/823680
- Guiru Gu;
- Yunfeng Ling;
- Runyu Liu;
- Vasinajindakaw, Puminun;
- Xuejun Lu;
- Jones, Carissa S.;
- Wu-Sheng Shih;
- Kayastha, Vijaya;
- Downing, Nick L.;
- Xuliang Han;
- Subbaraman, Harish;
- Pham, Dan;
- Chen, Ray T.;
- Maggie Yihong Chen;
- Berger, Urs;
- Renn, Mike
- Article
22
- Neural Computing & Applications, 2008, v. 17, n. 2, p. 111, doi. 10.1007/s00521-007-0098-6
- Article
23
- EE: Evaluation Engineering, 2011, v. 50, n. 8, p. 34
- Albee, Alan;
- Smith, Michael J.
- Article
24
- EE: Evaluation Engineering, 2008, v. 47, n. 4, p. 41
- Hansen, Peter;
- Heide, Carl
- Article
25
- EE: Evaluation Engineering, 2007, v. 46, n. 11, p. 44
- Article
26
- EE: Evaluation Engineering, 2006, v. 45, n. 11, p. 26
- Holder, Steve;
- Bullard, Dan
- Article
27
- EE: Evaluation Engineering, 2006, v. 45, n. 8, p. 39
- Article
28
- EE: Evaluation Engineering, 2005, v. 44, n. 8, p. 36
- Article
29
- EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 70
- Article
30
- EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 10
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31
- EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 10
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32
- EE: Evaluation Engineering, 2004, v. 43, n. 3, p. 10
- Article
34
- EE: Evaluation Engineering, 2003, v. 42, n. 9, p. 18
- Article
35
- Revista Colombiana de Física, 2008, v. 40, n. 2, p. 399
- Cabrera-López, J. J.;
- Medina, J. Velasco
- Article
36
- Pacing & Clinical Electrophysiology, 1995, v. 18, n. 10, p. 1947, doi. 10.1111/j.1540-8159.1995.tb03842.x
- Malik, Daniel;
- Hnatkova, Katerena;
- Malik, Marek
- Article
37
- ARSC Journal, 2012, v. 43, n. 2, p. 235
- Article
38
- ARSC Journal, 2010, v. 41, n. 1, p. 83
- Article
39
- Cinema Journal, 2006, v. 45, n. 2, p. 108
- Article
40
- Cinema Journal, 2004, v. 43, n. 3, p. 93, doi. 10.1353/cj.2004.0015
- Article
41
- Leonardo Music Journal, 2014, v. 24, n. 1, p. 65, doi. 10.1162/LMJ_a_00206
- Article
42
- Leonardo Music Journal, 2014, v. 24, n. 1, p. 53, doi. 10.1162/LMJ_a_00203
- Connolly, James;
- Evans, Kyle
- Article
43
- Radiophysics & Quantum Electronics, 2005, v. 48, n. 2, p. 142, doi. 10.1007/s11141-005-0056-z
- Bochkov, G.;
- Gorokhov, K.;
- Dubkov, A.
- Article
44
- Optometric Education, 2017, v. 42, n. 3, p. 3
- Article
45
- Pharmacy World & Science, 2008, v. 30, n. 5, p. 563
- Article
46
- Optical & Quantum Electronics, 2017, v. 49, n. 10, p. 1, doi. 10.1007/s11082-017-1155-8
- Article
47
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 291, doi. 10.1007/s10836-015-5523-7
- Wang, Li;
- Guo, Lianping;
- Jiang, Jun;
- Qiu, Duyu
- Article
48
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 243, doi. 10.1007/s10836-014-5445-9
- Xie, Yongle;
- Li, Xifeng;
- Xie, Sanshan;
- Xie, Xuan;
- Zhou, Qizhong
- Article
49
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 715, doi. 10.1007/s10836-013-5407-7
- Article
50
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 555, doi. 10.1007/s10836-013-5382-z
- Ao, Yongcai;
- Shi, Yibing;
- Zhang, Wei;
- Li, Yanjun
- Article