Works matching DE "ANALOG circuits"
1
- Journal of Multiple-Valued Logic & Soft Computing, 2025, v. 45, n. 1-3, p. 1
- Article
2
- Mathematics (2227-7390), 2025, v. 13, n. 11, p. 1872, doi. 10.3390/math13111872
- Tamba, Victor Kamdoum;
- Ngoko, Gaetant;
- Pham, Viet-Thanh;
- Grassi, Giuseppe
- Article
3
- Quantum Information Processing, 2025, v. 24, n. 5, p. 1, doi. 10.1007/s11128-025-04742-5
- Wang, Qikun;
- Wang, Zhao;
- Hu, Tianyang;
- Mai, Jun;
- Ma, Wei;
- Wang, Xu
- Article
4
- Fractal & Fractional, 2025, v. 9, n. 5, p. 273, doi. 10.3390/fractalfract9050273
- Zhang, Rongbo;
- Qiu, Kun;
- Liu, Chuang;
- Ma, Hongli;
- Chu, Zhaobi
- Article
5
- International Journal of Fuzzy Systems, 2025, v. 27, n. 4, p. 1154, doi. 10.1007/s40815-024-01826-9
- Feng, Teng;
- Deng, Shuwei;
- Duan, Qianwen;
- Mao, Yao
- Article
6
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 3467, doi. 10.1007/s11664-024-11554-3
- Dash, Sandeep K.;
- De, Bishnu Prasad;
- Appasani, Bhargav;
- Rout, NK
- Article
7
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 3452, doi. 10.1007/s11664-024-11547-2
- Dash, Sandeep Kumar;
- De, Bishnu Prasad;
- Ghosh, Sumalya;
- Rout, Nirmal Kumar;
- Panda, Ganapati
- Article
8
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 4216, doi. 10.1007/s11664-024-11517-8
- Zhang, Chenyu;
- He, Jiazhen;
- Jiang, Lingfan;
- Xu, Yonggang;
- Hou, Xinyu
- Article
9
- Journal of Electronic Materials, 2025, v. 54, n. 4, p. 3161, doi. 10.1007/s11664-025-11787-w
- Wang, Qi;
- He, Longhui;
- Zuo, Chunxiang;
- Zeng, Weiao;
- Chen, Zhiquan;
- Wu, Muhao;
- He, Yongwei;
- Xu, Hui;
- Tang, Yibo
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2301, doi. 10.1007/s10854-017-8146-1
- Yuan, Yafei;
- Cao, Xinran;
- Sun, Yan;
- Su, Jing;
- Liu, Chunmin;
- Cheng, Ling;
- Li, Yaopeng;
- Yuan, Lihua;
- Zhang, Hao;
- Li, Jing
- Article
11
- Measurement Techniques, 2022, v. 65, n. 5, p. 373, doi. 10.1007/s11018-022-02094-5
- Lupanova, E. A.;
- Nikulin, S. M.
- Article
12
- Measurement Techniques, 2016, v. 58, n. 10, p. 1144, doi. 10.1007/s11018-015-0856-2
- Article
13
- Measurement Techniques, 2015, v. 58, n. 4, p. 367, doi. 10.1007/s11018-015-0718-y
- Article
14
- Measurement Techniques, 2015, v. 58, n. 1, p. 59, doi. 10.1007/s11018-015-0663-9
- Bezdenezhnykh, S.;
- Kaminskii, O.;
- Stal'nova, K.
- Article
15
- Chips, 2023, v. 2, n. 1, p. 31, doi. 10.3390/chips2010003
- Bontems, William;
- Dzahini, Daniel
- Article
16
- Chips, 2023, v. 2, n. 1, p. 1, doi. 10.3390/chips2010001
- Rodovalho, Luís Henrique;
- Toledo, Pedro;
- Mir, Farzad;
- Ebrahimi, Farshad
- Article
17
- Chips, 2023, v. 2, n. 1, p. 20, doi. 10.3390/chips2010002
- Russo, Nicola;
- Huang, Haochun;
- Donati, Eugenio;
- Madsen, Thomas;
- Nikolic, Konstantin
- Article
18
- Electronic Science & Technology, 2025, v. 38, n. 2, p. 23, doi. 10.16180/j.cnki.issn1007-7820.2025.02.004
- Article
19
- Electronic Science & Technology, 2025, v. 38, n. 3, p. 68, doi. 10.16180/j.cnki.issn1007-7820.2025.03.009
- Article
20
- Experimental Technology & Management, 2023, v. 40, n. 5, p. 141, doi. 10.16791/j.cnki.sjg.2023.05.023
- Article
21
- Advanced Electronic Materials, 2021, v. 7, n. 5, p. 1, doi. 10.1002/aelm.202100117
- Han, Joon‐Kyu;
- Lee, Mun‐Woo;
- Yu, Ji‐Man;
- Choi, Yang‐Kyu
- Article
22
- Computational Intelligence in Electrical Engineering, 2023, v. 14, n. 3, p. 114, doi. 10.22108/isee.2023.136513.1612
- Shamaee, Zeinab;
- Mivehchy, Mohsen;
- Kazemi, Iraj
- Article
23
- AIMS Bioengineering, 2022, v. 9, n. 2, p. 145, doi. 10.3934/bioeng.2022011
- Waqas, Maria;
- Ainuddin, Urooj;
- Iftikhar, Umar
- Article
24
- Telecommunication Engineering, 2023, v. 63, n. 7, p. 1093, doi. 10.20079/j.issn.1001-893x.220921005
- Article
25
- Journal of Chongqing University of Posts & Telecommunications (Natural Science Edition) / Chongqing Youdian Daxue Xuebao (Ziran Kexue Ban), 2021, v. 33, n. 2, p. 319, doi. 10.3979/j.issn.1673-825X.201905130185
- Article
26
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1126, doi. 10.1002/j.2168-0159.2012.tb05991.x
- Yang, Chao-Yu;
- Huang, Shih-Che;
- Chiu, Hao-Lin;
- Hsieh, Ting;
- Yeh, Bo-Liang;
- Lin, Ching Shun;
- Liao, Ta-Wen;
- Tseng, Hsien-Kai;
- Lin, Chun Nan;
- Tsai, Wen Ching
- Article
27
- International Journal of Electronics Letters, 2024, v. 12, n. 1, p. 59, doi. 10.1080/21681724.2022.2148286
- Article
28
- International Journal of Electronics Letters, 2020, v. 8, n. 3, p. 269, doi. 10.1080/21681724.2019.1600726
- Yakout, Mohamed A.;
- Alawadi, Tareq A.
- Article
29
- Transactions of the Institute of Measurement & Control, 2019, v. 41, n. 3, p. 668, doi. 10.1177/0142331218764790
- Shaw, Priyabrata;
- Garanayak, Priyabrat
- Article
30
- Iraqi Journal for Electrical & Electronic Engineering, 2010, v. 6, n. 2, p. 139, doi. 10.33762/eeej.2010.54884
- Ali, Fakhrulddin H.;
- Hussein, Mohammed Mahmood;
- Ismael, Sinan M. B.
- Article
31
- Progress in Electromagnetics Research Letters, 2023, n. 111, p. 35, doi. 10.2528/pierl23042403
- Lei Deng;
- Shixing Yu;
- Na Kou
- Article
32
- Advances in Power Electronics, 2017, p. 1, doi. 10.1155/2017/9409801
- Mhiri, Nesrine;
- Alahdal, Abdulrahman;
- Ghulman, Hamza;
- Ammous, Anis
- Article
33
- Australian Journal of Electrical & Electronic Engineering, 2023, v. 20, n. 3, p. 251, doi. 10.1080/1448837X.2023.2177334
- Kumar, Atul;
- Chaturvedi, Bhartendu;
- Mohan, Jitendra
- Article
34
- Australian Journal of Electrical & Electronic Engineering, 2021, v. 18, n. 4, p. 237, doi. 10.1080/1448837X.2021.1966958
- Article
35
- Australian Journal of Electrical & Electronic Engineering, 2021, v. 18, n. 1, p. 36, doi. 10.1080/1448837X.2021.1909832
- Article
36
- Modern Physics Letters B, 2022, v. 36, n. 1, p. 1, doi. 10.1142/S0217984921505382
- Lai, Qiang;
- Wang, Ziling;
- Kuate, Paul Didier Kamdem
- Article
37
- Modern Physics Letters B, 2021, v. 35, n. 10, p. N.PAG, doi. 10.1142/S0217984921501876
- Lai, Qiang;
- Wan, Zhiqiang;
- Kamdem Kuate, Paul Didier;
- Fotsin, Hilaire
- Article
38
- Neural Computing & Applications, 2021, v. 33, n. 16, p. 10537, doi. 10.1007/s00521-021-05810-4
- Gao, Tianyu;
- Yang, Jingli;
- Jiang, Shouda
- Article
39
- Neural Computing & Applications, 2017, v. 28, n. 5, p. 1109, doi. 10.1007/s00521-015-2112-8
- Ranjbar, Mahnaz;
- Amiri, Mahmood
- Article
40
- Neural Computing & Applications, 2013, v. 23, n. 2, p. 519, doi. 10.1007/s00521-012-0947-9
- Sheikhan, Mansour;
- Sha'bani, Amir
- Article
41
- 2015
- Jiayun Yan;
- Guangyu Bin;
- Yan, Jiayun;
- Bin, Guangyu
- journal article
42
- International Journal of Antennas & Propagation, 2023, v. 2023, p. 1, doi. 10.1155/2023/4538182
- Article
43
- Optical & Quantum Electronics, 2017, v. 49, n. 10, p. 1, doi. 10.1007/s11082-017-1155-8
- Article
44
- Journal of Intelligent Manufacturing, 2024, v. 35, n. 1, p. 275, doi. 10.1007/s10845-022-02042-8
- Chien, Chen-Fu;
- Wu, Hsin-Jung
- Article
45
- Journal of Intelligent Manufacturing, 2022, v. 33, n. 3, p. 785, doi. 10.1007/s10845-020-01680-0
- Fu, Wenhan;
- Chien, Chen-Fu;
- Tang, Lizhen
- Article
46
- Journal of Electronic Testing, 2019, v. 35, n. 3, p. 317, doi. 10.1007/s10836-019-05795-y
- Kundu, Rahul;
- Su, Fei;
- Goteti, Prashant
- Article
47
- Journal of Electronic Testing, 2018, v. 34, n. 4, p. 371, doi. 10.1007/s10836-018-5743-8
- Article
48
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 313, doi. 10.1007/s10836-018-5713-1
- Shi, Congyin;
- Lee, Sanghoon;
- Aguilar, Sergio Soto;
- Sánchez-Sinencio, Edgar
- Article
49
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 697, doi. 10.1007/s10836-017-5697-2
- Yuan, Zhijie;
- He, Yigang;
- Yuan, Lifen;
- Cheng, Zhen
- Article
50
- Journal of Electronic Testing, 2017, v. 33, n. 5, p. 543, doi. 10.1007/s10836-017-5686-5
- Article