Works about AMORPHOUS semiconductors
1
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 222, n. 11, p. 1, doi. 10.1002/pssa.202400857
- Sun, Jiwon;
- Bae, Jinbaek;
- Lim, Taebin;
- Jeong, Myeonggi;
- Nahar, Sabiqun;
- Kim, Yuna;
- Jang, Jin
- Article
2
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 605, doi. 10.1142/S0219581X11008435
- MISHRA, DEBABRATA;
- PERUMAL, A.;
- SRINIVASAN, A.
- Article
3
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 635, doi. 10.1142/S0219581X11009155
- Article
4
- International Journal of Nanoscience, 2005, v. 4, n. 5/6, p. 1025, doi. 10.1142/S0219581X05004017
- Manna, I.;
- Nandi, P.;
- Bandyopadhyay, B.;
- Nambissan, P. M. G.;
- Ghoshray, K.;
- Ghoshray, A.
- Article
5
- Advanced Functional Materials, 2016, v. 26, n. 17, p. 2820, doi. 10.1002/adfm.201505274
- Pudasaini, Pushpa Raj;
- Noh, Joo Hyon;
- Wong, Anthony T.;
- Ovchinnikova, Olga S.;
- Haglund, Amanda V.;
- Dai, Sheng;
- Ward, Thomas Zac;
- Mandrus, David;
- Rack, Philip D.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1095, doi. 10.1007/s10854-008-9833-8
- Mikla, V. I.;
- Mikla, V. V.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1059, doi. 10.1007/s10854-009-9951-y
- Mikla, V. I.;
- Mikla, V. V.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 10, p. 1033, doi. 10.1007/s10854-008-9825-8
- Orapunt, Farida;
- O'Leary, Stephen K.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 23, doi. 10.1007/s10854-007-9424-0
- Bozsoki, Peter;
- Hoyer, Walter;
- Kira, Mackillo;
- Varga, Imre;
- Thomas, Peter;
- Koch, Stephan W.;
- Schomerus, Henning
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 801, doi. 10.1007/s10854-007-9452-9
- Hossain, Maruf;
- Minseong Yun;
- Korampally, Venumadhav;
- Gangopadhyay, Shubhra
- Article
11
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 251, doi. 10.1007/s10854-007-9206-8
- Article
12
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 309, doi. 10.1007/s10854-007-9222-8
- Stradins, P.;
- Teplin, C. W.;
- Young, D. L.;
- Yan, Y.;
- Branz, H. M.;
- Wang, Q.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 243, doi. 10.1007/s10854-007-9193-9
- Kazitsyna-Baranovski, S.;
- Weiser, G.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 4, p. 381, doi. 10.1007/s10854-006-9057-8
- Haiming Zhang;
- Guoxiang Chen;
- Guangwu Yang;
- Jiawei Zhang;
- Xiaoyuan Lu
- Article
15
- Journal of Materials Science Letters, 2003, v. 22, n. 19, p. 1377, doi. 10.1023/A:1025703831718
- Article
16
- Journal of Materials Science Letters, 2003, v. 22, n. 15, p. 1079, doi. 10.1023/A:1024982723808
- Ching-Ming Hsu;
- Ming-Chang Yu
- Article
18
- Drug Development & Industrial Pharmacy, 2008, v. 34, n. 6, p. 642, doi. 10.1080/03639040701842451
- Panchagnula, Ramesh;
- Bhardwaj, Vivekanand
- Article
19
- Ferroelectrics, 2004, v. 307, n. 1, p. 191, doi. 10.1080/00150190490493087
- Bataronov, I. L.;
- Posmet'yev, V. V.;
- Barmin, Yu. V.
- Article
20
- Ferroelectrics, 2004, v. 302, n. 1, p. 433, doi. 10.1080/00150190490453658
- Korotkov, L.;
- Gridnev, S.;
- Klimentova, T.;
- Dvornikov, V.;
- Barmin, Yu.;
- Kozhukhar, S.;
- Posmet'yev, V.;
- Urasov, D.
- Article
21
- Ferroelectrics, 2004, v. 298, n. 1, p. 183, doi. 10.1080/00150190490423552
- Korotkov, L.;
- Gridnev, S.;
- Dvornikov, V.;
- Kozhukhar, S.;
- Posmet'yev, V.
- Article
22
- Electronics (2079-9292), 2022, v. 11, n. 19, p. 3137, doi. 10.3390/electronics11193137
- Cai, Minxi;
- Xu, Piaorong;
- Liu, Bei;
- Peng, Ziqi;
- Cai, Jianhua;
- Cao, Jing
- Article
23
- Electronics (2079-9292), 2022, v. 11, n. 19, p. 3094, doi. 10.3390/electronics11193094
- Kim, Jong-Woo;
- Park, Seong-Geon;
- Yang, Min Kyu;
- Ju, Byeong-Kwon
- Article
24
- Electronics (2079-9292), 2022, v. 11, n. 18, p. N.PAG, doi. 10.3390/electronics11182822
- Jeon, Sang-Hwa;
- Wang, Ziyuan;
- Seo, Kyeong-Ho;
- Feng, Junhao;
- Zhang, Xue;
- Park, Jaehoon;
- Bae, Jin-Hyuk
- Article
25
- Electronics (2079-9292), 2022, v. 11, n. 14, p. N.PAG, doi. 10.3390/electronics11142263
- Lee, Se-Hyeong;
- Bak, So-Young;
- Yi, Moonsuk
- Article
26
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05991
- Sha, Z. D.;
- Quek, S. S.;
- Pei, Q. X.;
- Liu, Z. S.;
- Wang, T. J.;
- Shenoy, V. B.;
- Zhang, Y. W.
- Article
27
- Journal of Nano- & Electronic Physics, 2021, v. 13, n. 1, p. 01009-1, doi. 10.21272/jnep.13(1).01009
- Chala, S.;
- Boumaraf, R.;
- Bouhdjar, A. F.;
- Bdirina, M.;
- Labed, M.;
- Taouririt, T. E.;
- Elbar, M.;
- Sengouga, N.;
- Yakuphanoğlu, F.;
- Rahmane, S.;
- Naoui, Y.;
- Benbouzid, Y.
- Article
28
- Journal of Nano- & Electronic Physics, 2019, v. 11, n. 2, p. 1, doi. 10.21272/jnep.11(2).02008
- Article
29
- Journal of Nano- & Electronic Physics, 2017, v. 9, n. 5, p. 1, doi. 10.21272/jnep.9(5).05044
- Babychenko, O. Yu.;
- Pashchenko, A. G.
- Article
30
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 2, p. 02021-1
- Al-Agel, F. A.;
- Al-Marzouki, F. M.;
- Al-Ghamdi, A. A.;
- Khan, Shamshad A.;
- Al-Arfaj, E. A.;
- Husain, M.
- Article
31
- Fatigue & Fracture of Engineering Materials & Structures, 2007, v. 30, n. 1, p. 32, doi. 10.1111/j.1460-2695.2006.01054.x
- Article
32
- European Physical Journal B: Condensed Matter, 2011, v. 81, n. 3, p. 283, doi. 10.1140/epjb/e2011-10958-7
- Krzeminski, C.;
- Lampin, E.
- Article
33
- Advanced Energy Materials, 2016, v. 6, n. 21, p. n/a, doi. 10.1002/aenm.201670122
- Nam, Jiyoon;
- Lee, Youngjoo;
- Choi, Wonjung;
- Kim, Chang Su;
- Kim, Hogyoung;
- Kim, Jongbok;
- Kim, Dong‐Ho;
- Jo, Sungjin
- Article
34
- Geomicrobiology Journal, 2014, v. 31, n. 6, p. 480, doi. 10.1080/01490451.2013.822613
- Dhanjal, Soniya;
- Singh, Anil Kumar;
- Cameotra, Swaranjit Singh
- Article
35
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2024, v. 38, n. 7, p. 1, doi. 10.1142/S0217979224501066
- Article
36
- International Journal of High Speed Electronics & Systems, 2000, v. 10, n. 1, p. 13, doi. 10.1142/S0129156400000052
- Jang, Jin;
- Yoon, Soo Young
- Article
37
- Welding International, 2011, v. 25, n. 7, p. 491, doi. 10.1080/09507111003655366
- Tsumura, Takuya;
- Nakata, Kazuhiro
- Article
38
- Semiconductors, 2001, v. 35, n. 11, p. 1314, doi. 10.1134/1.1418078
- Article
39
- Semiconductors, 2001, v. 35, n. 8, p. 956, doi. 10.1134/1.1393035
- Mashin, A. I.;
- Khokhlov, A. F.;
- Domashevskaya, É. P.;
- Terekhov, V. A.;
- Mashin, N. I.
- Article
40
- Semiconductors, 2001, v. 35, n. 6, p. 637, doi. 10.1134/1.1379393
- Popov, A. I.;
- Vorontsov, V. A.;
- Popov, I. A.
- Article
41
- Semiconductors, 2001, v. 35, n. 3, p. 353, doi. 10.1134/1.1356161
- Kurova, I. A.;
- Ormont, N. N.;
- Terukov, E. I.;
- Trapeznikova, I. N.;
- Afanas’ev, V. P.;
- Gudovskikh, A. S.
- Article
42
- Semiconductors, 2001, v. 35, n. 2, p. 220, doi. 10.1134/1.1349936
- Ivanov-Omskiı, V. I.;
- Tolmatchev, A. V.;
- Yastrebov, S. G.
- Article
43
- Semiconductors, 2000, v. 34, n. 12, p. 1391, doi. 10.1134/1.1331797
- Ivanov-Omskiı, V. I.;
- Zvonareva, T. K.;
- Frolova, G. S.
- Article
44
- Semiconductors, 2000, v. 34, n. 7, p. 790, doi. 10.1134/1.1188074
- Nikolaev, Yu. A.;
- Rud’, V. Yu.;
- Rud’, Yu. V.;
- Terukov, E. I.
- Article
45
- Semiconductors, 2000, v. 34, n. 6, p. 658, doi. 10.1134/1.1188049
- Nikolaev, Yu. A.;
- Rud’, V. Yu.;
- Rud’, Yu. V.;
- Terukov, E. I.
- Article
46
- Semiconductors, 2000, v. 34, n. 7, p. 829, doi. 10.1134/1.1188083
- Terukov, E. I.;
- Kazanin, M. M.;
- Kon’kov, O. I.;
- Kudoyarova, V. Kh.;
- Kougiya, K. V.;
- Nikulin, Yu. A.;
- Kazanskiı, A. G.
- Article
47
- Semiconductors, 2000, v. 34, n. 6, p. 677, doi. 10.1134/1.1188054
- Nikolaev, Yu. A.;
- Rud’, V. Yu.;
- Rud’, Yu. V.;
- Terukov, E. I.
- Article
48
- Semiconductors, 2000, v. 34, n. 6, p. 717, doi. 10.1134/1.1188060
- Meytin, M. N.;
- Zeman, M.;
- Budaguan, B. G.;
- Metselaar, J. W.
- Article
49
- Semiconductors, 2000, v. 34, n. 6, p. 723, doi. 10.1134/1.1188061
- Article
50
- Semiconductors, 2000, v. 34, n. 6, p. 737, doi. 10.1134/1.1188064
- Golikova, O. A.;
- Kazanin, M. M.
- Article