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Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP.
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- Electronics (2079-9292), 2024, v. 13, n. 11, p. 2012, doi. 10.3390/electronics13112012
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Temperature Dependence of Total Ionizing Dose Effects of β-Ga 2 O 3 Schottky Barrier Diodes.
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- Electronics (2079-9292), 2024, v. 13, n. 11, p. 2215, doi. 10.3390/electronics13112215
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- Article
Characterization of Surface α-Particle Radiation, Internal Traceability and Simulation of Typical Tin Spheres.
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- Applied Sciences (2076-3417), 2024, v. 14, n. 10, p. 4257, doi. 10.3390/app14104257
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- Article
Study of High-Energy Proton Irradiation Effects in Top-Gate Graphene Field-Effect Transistors.
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- Electronics (2079-9292), 2023, v. 12, n. 23, p. 4837, doi. 10.3390/electronics12234837
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- Article
Mechanism and Equivalence of Single Event Effects Induced by 14 MeV Neutrons in High-Speed QDR SRAM.
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- Applied Sciences (2076-3417), 2022, v. 12, n. 19, p. 9685, doi. 10.3390/app12199685
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- Article
Experimental and simulation studies of radiation‐induced single event burnout in SiC‐based power MOSFETs.
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- IET Power Electronics (Wiley-Blackwell), 2021, v. 14, n. 9, p. 1700, doi. 10.1049/pel2.12147
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- Article
trans-Cinnamaldehyde Inhibits Microglial Activation and Improves Neuronal Survival against Neuroinflammation in BV2 Microglial Cells with Lipopolysaccharide Stimulation.
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- Evidence-based Complementary & Alternative Medicine (eCAM), 2017, v. 2017, p. 1, doi. 10.1155/2017/4730878
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