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Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic.
- Published in:
- XRS: X-ray Spectrometry, 2008, v. 37, n. 4, p. 462, doi. 10.1002/xrs.1073
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- Article
Chemical state analysis employing sub-natural linewidth resolution PIXE measurements of Kα diagram lines.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 4, p. 310, doi. 10.1002/xrs.822
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- Article
A study of PIXE continuum polarization properties.
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- XRS: X-ray Spectrometry, 2005, v. 34, n. 4, p. 335, doi. 10.1002/xrs.829
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- Article
Fundamental parameters approach in tube-excited secondary target XRF set-ups: comparison between theory and experiment.
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- XRS: X-ray Spectrometry, 2004, v. 33, n. 6, p. 447, doi. 10.1002/xrs.747
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- Article
Improvement of peak-to-background ratio in PIXE and XRF methods using thin Si-PIN detectors.
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- XRS: X-ray Spectrometry, 2003, v. 32, n. 2, p. 93, doi. 10.1002/xrs.621
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- Article
Theoretical study of a secondary target XRF setup at different operational tube voltages.
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- XRS: X-ray Spectrometry, 2001, v. 30, n. 2, p. 99, doi. 10.1002/xrs.479
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- Article
Combined Radioisotope XRF Analysis of Complex X-Ray Spectra in the Case of Magnetostrictive TbDyFe Thin Films.
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- XRS: X-ray Spectrometry, 1997, v. 26, n. 4, p. 174, doi. 10.1002/(SICI)1097-4539(199707)26:4<174::AID-XRS202>3.0.CO;2-B
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- Article