Fault‐tolerant delay cell for ring oscillator application in 65 nm CMOS technology.
- Published in:
- IET Circuits, Devices & Systems (Wiley-Blackwell), 2018, v. 12, n. 3, p. 233, doi. 10.1049/iet-cds.2017.0380
- By:
- Publication type:
- Article
Works by Zandevakili, Hamed
Results: 4
1
2
PROBABILISTIC TRANSFER MATRIX WITH MIXED BINARY-DECIMAL CODING FOR LOGIC CIRCUIT RELIABILITY ANALYSIS.
- Published in:
- Journal of Circuits, Systems & Computers, 2013, v. 22, n. 8, p. -1, doi. 10.1142/S0218126613500643
- By:
- Publication type:
- Article
3
A High-Performance MEMRISTOR-Based Smith-Waterman DNA Sequence Alignment Using FPNI Structure.
- Published in:
- Journal of Applied Research in Electrical Engineering, 2021, v. 1, n. 1, p. 59, doi. 10.22055/jaree.2021.36117.1016
- By:
- Publication type:
- Article
4
Gravitational search algorithm with both attractive and repulsive forces.
- Published in:
- Soft Computing - A Fusion of Foundations, Methodologies & Applications, 2019, v. 23, n. 3, p. 783, doi. 10.1007/s00500-017-2785-2
- By:
- Publication type:
- Article