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Angular Ellipsometry of Porous Silicon Surface Layers.
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- Journal of Nano- & Electronic Physics, 2020, v. 12, n. 3, p. 1, doi. 10.21272/jnep.12(3).03024
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Modification of Optical Properties of Surface Layers and Thin Films by Laser Treatment.
- Published in:
- Journal of Nano- & Electronic Physics, 2019, v. 11, n. 3, p. 1, doi. 10.21272/jnep.11(3).03032
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- Article