The Use of Different Pulsed Electron Irradiation for the Formation of Radiation Defects in Silicon Crystals.Published in:Journal of Electronic Materials, 2018, v. 47, n. 7, p. 4010, doi. 10.1007/s11664-018-6286-6By:Yeritsyan, H. N.;Sahakyan, A. A.;Grigoryan, N. E.;Harutyunyan, V. V.;Grigoryan, B. A.;Amatuni, G. A.;Petrosyan, V. H.;Khachatryan, A. A.;Rhodes, C. J.Publication type:Article