Found: 17
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Optical and thermal properties of doped semiconductor.
- Published in:
- European Physical Journal: Special Topics, 2008, v. 153, n. 1, p. 29, doi. 10.1140/epjst/e2008-00386-7
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- Article
PHOTOTHERMAL DEFLECTION ANALYSIS OF β-In<sub>2</sub>S<sub>3</sub> THIN FILMS: THE EFFECT OF S/In MOLAR RATIOS.
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- Surface Review & Letters, 2024, v. 31, n. 11, p. 1, doi. 10.1142/S0218625X24500860
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- Article
Enhanced Thermoelectric Properties of Sn<sub>x</sub>Sb<sub>2</sub>S<sub>y</sub> (1 ≤ x ≤ 3, 4 ≤ y ≤ 6) Thin Films.
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- Journal of Electronic Materials, 2022, v. 51, n. 12, p. 6770, doi. 10.1007/s11664-022-09936-6
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- Article
Thermal, Electrical and Dielectric Characteristics of SnSbS Thin Films for Solar Cell Applications.
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- Journal of Electronic Materials, 2020, v. 49, n. 2, p. 1354, doi. 10.1007/s11664-019-07782-7
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- Article
Investigation of the thermal annealing effect on the optical, thermal and electrical properties of Sn2Sb2S5 evaporated thin films.
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- Optical & Quantum Electronics, 2020, v. 52, n. 3, p. 1, doi. 10.1007/s11082-020-2250-9
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- Article
Photothermal investigation of poly (3-hexylthiophene): ZnSe nanocomposites.
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- Applied Physics A: Materials Science & Processing, 2015, v. 119, n. 2, p. 581, doi. 10.1007/s00339-015-8995-5
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- Article
Thermal analysis of a part of circuit board card by the photothermal deflection technique.
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- Applied Physics A: Materials Science & Processing, 2014, v. 116, n. 4, p. 1761, doi. 10.1007/s00339-014-8322-6
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- Article
Structural, morphologic and optical characterization of InAlS.
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- Applied Physics A: Materials Science & Processing, 2014, v. 116, n. 4, p. 2011, doi. 10.1007/s00339-014-8387-2
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- Article
Photothermal investigation Study of ZnO thin films: effects of Zn and O polar substrate.
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- Applied Physics A: Materials Science & Processing, 2014, v. 114, n. 2, p. 559, doi. 10.1007/s00339-013-7614-6
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- Article
Photothermal deflection investigation of bulk Si and GaSb transport properties.
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- Applied Physics A: Materials Science & Processing, 2013, v. 110, n. 2, p. 459, doi. 10.1007/s00339-012-7242-6
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- Article
Photothermal investigation study of porous silicon layer doped lithium.
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- Applied Physics A: Materials Science & Processing, 2013, v. 110, n. 1, p. 157, doi. 10.1007/s00339-012-7479-0
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- Article
Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD.
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- International Journal of Photoenergy, 2012, p. 1, doi. 10.1155/2012/418924
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- Article
Determination of thermal properties of some sulfide thin films using electropyroelectric method.
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- Journal of Thermal Analysis & Calorimetry, 2019, v. 136, n. 6, p. 2231, doi. 10.1007/s10973-018-7863-x
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- Article
A new method for thermo-electrical properties of GaSb by electro-pyroelectric technique.
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- Journal of Thermal Analysis & Calorimetry, 2017, v. 127, n. 1, p. 641, doi. 10.1007/s10973-016-5765-3
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- Article
Quantitave Alternative Method of Determining Hardness of Carburized Steel Annealed or Quenched by a CO<sub>2</sub>-Laser on the Basis of Carbon-Dependent Correlation Between Hardness and Thermal Diffusivity.
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- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 3, p. 232, doi. 10.1023/B:RUNT.0000009078.30951.d0
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- Article
Unraveling the effect of thickness on the structural, morphological, opto-thermal and DFT calculation of hematite Fe2O3 thin films for photo-catalytic application.
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- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 13, p. 17974, doi. 10.1007/s10854-021-06336-0
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- Article
Interface recombination velocity measurement in SiO/Si.
- Published in:
- Semiconductors, 2014, v. 48, n. 3, p. 302, doi. 10.1134/S1063782614030130
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- Article