Found: 9
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Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Uncovering Atomic and Nano-scale Deformations in Two-dimensional Lateral Heterojunctions.
- Published in:
- 2020
- By:
- Publication type:
- Abstract
Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector.
- Published in:
- Microscopy & Microanalysis, 2019, p. 194, doi. 10.1017/S1431927618001460
- By:
- Publication type:
- Article
Mapping Strain and Relaxation in 2D Heterojunctions with Sub-picometer Precision.
- Published in:
- Microscopy & Microanalysis, 2019, p. 1588, doi. 10.1017/S1431927618008425
- By:
- Publication type:
- Article
Real-space Demonstration of 0.4 Angstrom Resolution at 80 keV via Electron Ptychography with a High Dynamic Range Pixel Array Detector.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Mapping Strain and Relaxation in 2D Heterojunctions with Sub-picometer Precision.
- Published in:
- 2018
- By:
- Publication type:
- Abstract
Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD).
- Published in:
- Microscopy & Microanalysis, 2017, v. 23, p. 1712, doi. 10.1017/S1431927617009229
- By:
- Publication type:
- Article
Breaking Friedel’s Law in Polar Two Dimensional Materials.
- Published in:
- Microscopy & Microanalysis, 2017, v. 23, p. 1738, doi. 10.1017/S1431927617009357
- By:
- Publication type:
- Article
High-mobility three-atom-thick semiconducting films with wafer-scale homogeneity.
- Published in:
- Nature, 2015, v. 520, n. 7549, p. 656, doi. 10.1038/nature14417
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- Publication type:
- Article