Found: 1
Select item for more details and to access through your institution.
High resolution strain mapping of a single axially heterostructured nanowire using scanning X-ray diffraction.
- Published in:
- Nano Research, 2020, v. 13, n. 9, p. 2460, doi. 10.1007/s12274-020-2878-6
- By:
- Publication type:
- Article