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Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope.
Published in:
Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 3, p. i, doi. 10.1049/ell2.12430
By:
- Liu, Pengcheng;
- Han, Jianwei;
- Ma, Yingqi;
- Zhang, Feng;
- Wu, Zongguo;
- Zhu, Xiang;
- Cui, Yixin
Publication type:
Article
Front Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope.
Published in:
Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 3, p. i, doi. 10.1049/ell2.12373
By:
- Liu, Pengcheng;
- Han, Jianwei;
- Ma, Yingqi;
- Zhang, Feng;
- Wu, Zongguo;
- Zhu, Xiang;
- Cui, Yixin
Publication type:
Article
A frequency mapping method for locating functional units inside ICs based on coaxial microscope.
Published in:
Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 3, p. 115, doi. 10.1049/ell2.12373
By:
- Liu, Pengcheng;
- Han, Jianwei;
- Ma, Yingqi;
- Zhang, Feng;
- Wu, Zongguo;
- Zhu, Xiang;
- Cui, Yixin
Publication type:
Article