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A High-Resolution Texture Mapping Technique for 3D Textured Model.
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- Applied Sciences (2076-3417), 2018, v. 8, n. 11, p. 2228, doi. 10.3390/app8112228
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- Article
The development of a monitoring system for analyzing factors affecting film thickness in a sputtering process.
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- Modern Physics Letters B, 2020, v. 34, n. 7-9, p. N.PAG, doi. 10.1142/S0217984920400217
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- Publication type:
- Article