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Vacuum‐Healing of Grain Boundaries in Sodium‐Doped CuInSe<sub>2</sub> Solar Cell Absorbers.
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- Advanced Energy Materials, 2023, v. 13, n. 17, p. 1, doi. 10.1002/aenm.202204183
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- Article
Diffusion of cesium in silicon during SIMS experiments investigated by numerical simulations.
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- Surface & Interface Analysis: SIA, 2014, v. 46, p. 7, doi. 10.1002/sia.5608
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- Article
Fragmentation of polystyrene during sputter deposition in the storing matter instrument.
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- Surface & Interface Analysis: SIA, 2014, v. 46, p. 357, doi. 10.1002/sia.5649
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Nanoscale Surface Analysis Reveals Origins of Enhanced Interface Passivation in RbF Post Deposition Treated CIGSe Solar Cells.
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- Advanced Functional Materials, 2023, v. 33, n. 30, p. 1, doi. 10.1002/adfm.202300590
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- Article
In-situ Isotopic Analysis at Nanoscale using Parallel Ion Electron Spectrometry: A Powerful New Paradigm for Correlative Microscopy.
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- Scientific Reports, 2016, p. 28705, doi. 10.1038/srep28705
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Mechanisms of silicon sputtering and cluster formation explained by atomic level simulations.
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- Journal of Mass Spectrometry, 2014, v. 49, n. 3, p. 185, doi. 10.1002/jms.3317
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Sputtering of silicon by low-energy oxygen bombardment studied by MD simulations.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 356, doi. 10.1002/sia.4936
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Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 1, p. 513, doi. 10.1002/sia.5010
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NanoSIMS50 imaging of thin samples coupled with neutral cesium deposition.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 302, doi. 10.1002/sia.3550
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- Article
Elemental mapping of Neuromelanin organelles of human Substantia Nigra: correlative ultrastructural and chemical analysis by analytical transmission electron microscopy and nano-secondary ion mass spectrometry.
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- Journal of Neurochemistry, 2016, v. 138, n. 2, p. 339, doi. 10.1111/jnc.13648
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Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.297
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- Article
The IONMASTER magSIMS: An Innovative Multi-ion Species FIB Platform for Correlative High-resolution Ion Microscopy and SIMS Analyses.
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- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.237
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- Article
Scanning Transmission Ion Microscopy Time-of-Flight Spectroscopy Using 20 keV Helium Ions.
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- Microscopy & Microanalysis, 2023, v. 29, n. 2, p. 563, doi. 10.1093/micmic/ozac049
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5D-TOF-STIM Imaging with a Low-energy He<sup>+</sup> Focused Ion Beam.
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- 2023
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- Abstract
Multimodal Imaging of Hydrogen Distributions in Mg<sub>2</sub>Ni Hydrogen Storage Thin Films.
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- 2023
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- Abstract
Operando Elemental Imaging Using SIMS: Correlative Structural, Chemical, and Electrochemical Analysis of Solid-state Batteries.
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- 2023
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A FIB-SEM Based Correlative Methodology for X-Ray Nanotomography and Secondary Ion Mass Spectrometry: An Application Example in Lithium Batteries Research.
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- Microscopy & Microanalysis, 2022, v. 28, n. 6, p. 1890, doi. 10.1017/S1431927622012405
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Imaging and Quantification of Hydrogen in Materials: SIMS Based Correlative Microscopy.
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- 2022
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SIMS Imaging Performed on Focused Ion Beam - based Platforms.
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- 2022
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Elucidation of 3D Chemical and Physical Architecture of Soil Microstructures by Correlating Spectro-Microscopic Techniques and Developing Novel Computational Methods.
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- 2022
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4D Reconstructions from Microscale Photogrammetry: Correlation of 3D Surface Representations with SIMS to Link Microstructural Topography and Chemical Information.
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- 2022
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Contrast Mechanisms in Transmission Microscopy Using keV Helium Ions.
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- 2022
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SIMS Performed on Focused Ion Beam Instruments : In-situ Correlative Structural and Chemical Imaging.
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- 2022
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Transmission ion microscopy and time-of-flight spectroscopy.
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- 2021
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Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging.
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- 2021
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New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy.
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- 2021
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In-situ multi-modal microscopy using finely focused ion and electron beams.
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- 2021
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Transmission ion microscopy and time-of-flight spectroscopy.
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- 2021
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New Imaging modality for surface and sub-surface imaging using Scanning Transmission Helium Ion Microscopy.
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- 2021
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In-situ multi-modal microscopy using finely focused ion and electron beams.
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- 2021
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npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations.
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- 2020
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Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments.
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- 2020
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Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue.
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- 2020
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Advanced Analytical Capabilities on FIB Instruments Using SIMS.
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- 2020
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- Abstract
npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations.
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- 2020
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- Abstract
Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments.
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- 2020
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- Abstract
Correlative Electron Microscopy, High Resolution Ion Imaging and Secondary Ion Mass Spectrometry for High Resolution Nanoanalytics on Biological Tissue.
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- 2020
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- Abstract
Advanced Analytical Capabilities on FIB Instruments Using SIMS.
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- 2020
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- Abstract
Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials.
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- 2019
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- Abstract
Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications.
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- Microscopy & Microanalysis, 2019, p. 404, doi. 10.1017/S1431927618002519
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- Article
In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry.
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- Microscopy & Microanalysis, 2019, p. 380, doi. 10.1017/S1431927618002398
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Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials.
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- 2018
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- Abstract
Image Fusion in SIMS-based Correlative Microscopy: Methodology and Applications.
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- 2018
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- Abstract
In Situ Correlative Microscopy Combining Transmission Electron Microscopy and Secondary Ion Mass Spectrometry.
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- 2018
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Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology.
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- Microscopy & Microanalysis, 2014, v. 20, n. S3, p. 970, doi. 10.1017/S1431927614006576
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- Article
Light Stability Enhancement of Perovskite Solar Cells Using 1H,1H,2H,2H‐Perfluorooctyltriethoxysilane Passivation.
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- Solar RRL, 2021, v. 5, n. 3, p. 1, doi. 10.1002/solr.202000650
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Front Cover: Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation (Small Methods 7/2021).
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- Small Methods, 2021, v. 5, n. 7, p. 1, doi. 10.1002/smtd.202170028
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Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation.
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- Small Methods, 2021, v. 5, n. 7, p. 1, doi. 10.1002/smtd.202100223
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High-Resolution Topographic and Chemical Surface Imaging of Chalk for Oil Recovery Improvement Applications.
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- Minerals (2075-163X), 2022, v. 12, n. 3, p. 356, doi. 10.3390/min12030356
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Transition metals and trace elements in the retinal pigment epithelium and choroid: correlative ultrastructural and chemical analysis by analytical electron microscopy and nano-secondary ion mass spectrometry.
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- Metallomics, 2018, v. 10, n. 2, p. 296, doi. 10.1039/c7mt00259a
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