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Infrared Radiation from Dust in Seyfert Galaxies.
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- Nature, 1969, v. 223, n. 5208, p. 788, doi. 10.1038/223788a0
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- Article
Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing.
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- Surface & Interface Analysis: SIA, 2015, v. 47, n. 1, p. 15, doi. 10.1002/sia.5632
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Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy data.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 5, p. 321, doi. 10.1002/sia.5482
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Surface excitations in electron spectroscopy. Part I: dielectric formalism and Monte Carlo algorithm.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 5, p. 873, doi. 10.1002/sia.5175
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- Article
Effective attenuation lengths for photoelectrons in thin films of silicon oxynitride and hafnium oxynitride on silicon.
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- Surface & Interface Analysis: SIA, 2013, v. 45, n. 2, p. 628, doi. 10.1002/sia.5103
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- Article
Surface roughness, waviness, and shape induced effects in angle-resolved XPS Surface roughness, waviness, and shape induced effects in angle-resolved XPS.
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- Surface & Interface Analysis: SIA, 2012, v. 44, n. 8, p. 1096, doi. 10.1002/sia.3858
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- Article
Effect of surface roughness on angle-resolved XPS Effect of surface roughness on angle-resolved XPS.
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- Surface & Interface Analysis: SIA, 2012, v. 44, n. 8, p. 1119, doi. 10.1002/sia.4886
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Effects of elastic scattering and analyzer-acceptance angle on the analysis of angle-resolved X-ray photoelectron spectroscopy data.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 7, p. 1046, doi. 10.1002/sia.3689
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- Article
Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulations.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 6, p. 934, doi. 10.1002/sia.3661
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- Article
In situ spectroscopic ellipsometry as a sensor for hard coatings and steel nitriding.
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- Surface & Interface Analysis: SIA, 2002, v. 34, n. 1, p. 681, doi. 10.1002/sia.1387
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- Article
Comparison of source functions obtained by using QUASES and partial intensity analysis for inelastic background correction: KLL Auger spectra of 3d transition elements Cu and Ni.
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- Surface & Interface Analysis: SIA, 2002, v. 33, n. 8, p. 681, doi. 10.1002/sia.1442
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- Article
Electron scattering correction of x-ray-excited Ni and Cu KLL Auger spectra emitted from thin and thick metallic samples†.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 2, p. 126, doi. 10.1002/(SICI)1096-9918(200002)29:2<126::AID-SIA704>3.0.CO;2-X
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Self-consistent Calibration of TixC1-x Auger Spectra
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 8, p. 590
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Elimination of the Inelastic Tail and Suppression of the Background of Secondaries and Backscattered Primaries in AES/XPS Spectra
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- Surface & Interface Analysis: SIA, 1998, v. 26, n. 6, p. 455
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- Article
Calculation of ionization depth distributions and backscattering coefficients applying a new Monte Carlo simulation approach.
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- XRS: X-ray Spectrometry, 1998, v. 27, n. 6, p. 373, doi. 10.1002/(SICI)1097-4539(199811/12)27:6<373::AID-XRS283>3.0.CO;2-T
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FAR-INFRARED POLARIMETRY OF THE INTERSTELLAR MEDIUM.
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- EAS Publications Series, 2011, v. 52, p. 259, doi. 10.1051/eas/1152042
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- Article
CONFIRMATION OF C<sub>60</sub> IN THE REFLECTION NEBULA NGC 7023.
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- EAS Publications Series, 2011, v. 46, p. 209, doi. 10.1051/eas/1146022
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- Article
Maximum entropy analysis of the effects of elastic scattering on the reconstruction of depth profiles from angle-dependent XPS measurements.
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- Surface & Interface Analysis: SIA, 1994, v. 21, n. 1, p. 38, doi. 10.1002/sia.740210106
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A new formalism for angle-resolved X-ray photoelectron spectroscopy (ARXPS) and Auger electron spectroscopy (ARAES) of non-crystalline solids taking elastic electron scattering into account.
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- Surface & Interface Analysis: SIA, 1992, v. 19, n. 1-12, p. 83, doi. 10.1002/sia.740190119
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Towards a universal curve for electron attenuation: Elastic scattering data for 45 elements.
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- Surface & Interface Analysis: SIA, 1992, v. 18, n. 3, p. 217, doi. 10.1002/sia.740180307
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Analytical expression describing the attenuation of Auger electrons and photoelectrons in solids.
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- Surface & Interface Analysis: SIA, 1991, v. 17, n. 10, p. 693, doi. 10.1002/sia.740171003
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Probing the mass and structure of the Ring Nebula in Lyra with SOFIA/GREAT observations of the [CM] 158 micron line.
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- Astronomy & Astrophysics / Astronomie et Astrophysique, 2012, v. 542, n. 1, p. 1, doi. 10.1051/0004-6361/201219021
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