Found: 11
Select item for more details and to access through your institution.
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part II- chemically-mechanically planarized samples.
- Published in:
- Scanning, 2001, v. 23, n. 6, p. 366, doi. 10.1002/sca.4950230602
- By:
- Publication type:
- Article
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1- applications to accurate dimension measurements.
- Published in:
- Scanning, 2001, v. 23, n. 5, p. 298, doi. 10.1002/sca.4950230502
- By:
- Publication type:
- Article
Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope.
- Published in:
- Scanning, 1999, v. 21, n. 6, p. 368, doi. 10.1002/sca.4950210602
- By:
- Publication type:
- Article
Reduction of edge penetration effect in the scanning electron microscope.
- Published in:
- Scanning, 1986, v. 8, n. 3, p. 120, doi. 10.1002/sca.4950080304
- By:
- Publication type:
- Article
Endogenous opioids regulate moment-to-moment neuronal communication and excitability.
- Published in:
- Nature Communications, 2017, v. 8, n. 3, p. 14611, doi. 10.1038/ncomms14611
- By:
- Publication type:
- Article
Relationship between type-1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field.
- Published in:
- Journal of Microscopy, 1986, v. 144, n. 1, p. RP1, doi. 10.1111/j.1365-2818.1986.tb04667.x
- By:
- Publication type:
- Article
Some theoretical aspects of type-1 magnetic contrast in the scanning electron microscope.
- Published in:
- Journal of Microscopy, 1985, v. 139, n. 2, p. 187, doi. 10.1111/j.1365-2818.1985.tb02635.x
- By:
- Publication type:
- Article
Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM).
- Published in:
- Journal of Microscopy, 1985, v. 138, n. 1, p. RP3, doi. 10.1111/j.1365-2818.1985.tb02590.x
- By:
- Publication type:
- Article
Fundamental theorem for type-1 magnetic contrast in the scanning electron microscope (SEM).
- Published in:
- Journal of Microscopy, 1983, v. 131, n. 3, p. RP5, doi. 10.1111/j.1365-2818.1983.tb04253.x
- By:
- Publication type:
- Article
Method for measuring the field from a magnetic recording head in the scanning electron microscope.
- Published in:
- Journal of Microscopy, 1983, v. 130, n. 1, p. RP1, doi. 10.1111/j.1365-2818.1983.tb04192.x
- By:
- Publication type:
- Article
Effects of collector take-off angle and energy filtering on the BSE image in the SEM.
- Published in:
- Scanning, 1979, v. 2, n. 4, p. 199, doi. 10.1002/sca.4950020402
- By:
- Publication type:
- Article