Works matching AU Weide Lu

Reliability Analysis of the Sealed Relay Based on Degradation Data.

Published in:

IEEJ Transactions on Electrical & Electronic Engineering, 2018, v. 13, n. 3, p. 362, doi. 10.1002/tee.22576

By:

• Wenhua Li;
• Lulu Zhou;
• Weide Lu

Publication type:

Article