Found: 5

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  • Hidden Defects and Unexpected Properties of Graphene — How Advanced TEM Contributes to Materials Development.

    Published in:
    Microscopy & Microanalysis, 2017, v. 23, p. 1752, doi. 10.1017/S1431927617009424
    By:
    • Butz, Benjamin;
    • Dolle, Christian;
    • Niekiel, Florian;
    • Spiecker, Erdmann;
    • Weber, Konstantin;
    • Meyer, Bernd;
    • Waldmann, Daniel;
    • Kisslinger, Ferdinand;
    • Weber, Heiko B.;
    • Shallcross, Sam;
    • Halbig, Christian;
    • Eigler, Siegfried;
    • Ophus, Colin
    Publication type:
    Article

  • Emerging Thin-Film Photovoltaic Technologies.

    Published in:
    Chemie Ingenieur Technik (CIT), 2015, v. 87, n. 4, p. 376, doi. 10.1002/cite.201400101
    By:
    • Hermes, Wilfried;
    • Waldmann, Daniel;
    • Agari, Michaela;
    • Schierle-Arndt, Kerstin;
    • Erk, Peter
    Publication type:
    Article

  • Dislocations in bilayer graphene.

    Published in:
    Nature, 2014, v. 505, n. 7484, p. 533, doi. 10.1038/nature12780
    By:
    • Butz, Benjamin;
    • Dolle, Christian;
    • Niekiel, Florian;
    • Weber, Konstantin;
    • Waldmann, Daniel;
    • Weber, Heiko B.;
    • Meyer, Bernd;
    • Spiecker, Erdmann
    Publication type:
    Article

  • Bottom-gated epitaxial graphene.

    Published in:
    Nature Materials, 2011, v. 10, n. 5, p. 357, doi. 10.1038/nmat2988
    By:
    • Waldmann, Daniel;
    • Jobst, Johannes;
    • Speck, Florian;
    • Seyller, Thomas;
    • Krieger, Michael;
    • Weber, Heiko B.
    Publication type:
    Article

  • Towards wafer-size graphene layers by atmospheric pressure graphitization of silicon carbide.

    Published in:
    Nature Materials, 2009, v. 8, n. 3, p. 203, doi. 10.1038/nmat2382
    By:
    • Emtsev, Konstantin V.;
    • Bostwick, Aaron;
    • Horn, Karsten;
    • Jobst, Johannes;
    • Kellogg, Gary L.;
    • Ley, Lothar;
    • McChesney, Jessica L.;
    • Ohta, Taisuke;
    • Reshanov, Sergey A.;
    • Röhrl, Jonas;
    • Rotenberg, Eli;
    • Schmid, Andreas K.;
    • Waldmann, Daniel;
    • Weber, Heiko B.;
    • Seyller, Thomas
    Publication type:
    Article