Found: 6
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Effects of gate stack structural and process defectivity on high-k dielectric dependence of NBTI reliability in 32 nm technology node PMOSFETs.
- Published in:
- 2014
- By:
- Publication type:
- journal article
New Simulation Method to Characterize the Recoverable Component of Dynamic Negative-Bias Temperature Instability in p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors.
- Published in:
- Journal of Electronic Materials, 2014, v. 43, n. 4, p. 1207, doi. 10.1007/s11664-014-2978-8
- By:
- Publication type:
- Article
Male Infertility: Evaluation and Treatment.
- Published in:
- IIUM Medical Journal Malaysia, 2020, v. 19, n. 3, p. 92, doi. 10.31436/imjm.v19i3.1670
- By:
- Publication type:
- Article
Effect of Trihoney (A Mixture of Trigona, Mellifera and Tualang) on Male Reproductive Hormones and Insulin Resistance in Hypercholesterolaemic Rabbits.
- Published in:
- IIUM Medical Journal Malaysia, 2020, v. 19, n. 3, p. 21, doi. 10.31436/imjm.v19i3.1661
- By:
- Publication type:
- Article
Elastomeric polydimethylsiloxane polymer on conductive interdigitated electrode for analyzing skin hydration dynamics.
- Published in:
- Applied Physics A: Materials Science & Processing, 2020, v. 126, n. 9, p. N.PAG, doi. 10.1007/s00339-020-03933-4
- By:
- Publication type:
- Article
Effects of Gate Stack Structural and Process Defectivity on High-κ Dielectric Dependence of NBTI Reliability in 32 nm Technology Node PMOSFETs.
- Published in:
- Scientific World Journal, 2014, p. 1, doi. 10.1155/2014/490829
- By:
- Publication type:
- Article