Found: 20
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Limits of Resolutions in the Scanning Electron Microscope.
- Published in:
- 2023
- By:
- Publication type:
- Abstract
Traceable Measurements using a Metrology Scanning Electron Microscope.
- Published in:
- 2022
- By:
- Publication type:
- Abstract
Three-Dimensional (3D) Nanometrology Based on Scanning Electron Microscope (SEM) Stereophotogrammetry.
- Published in:
- Microscopy & Microanalysis, 2017, v. 23, n. 5, p. 967, doi. 10.1017/S1431927617012521
- By:
- Publication type:
- Article
Comparison of Electron Imaging Modes for Dimensional Measurements in the Scanning Electron Microscope.
- Published in:
- Microscopy & Microanalysis, 2016, v. 22, n. 4, p. 768, doi. 10.1017/S1431927616011430
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- Publication type:
- Article
APEX method and real-time blind deconvolution of scanning electron microscope imagery.
- Published in:
- Optical Engineering, 2002, v. 41, n. 10, p. 2499, doi. 10.1117/1.1499970
- By:
- Publication type:
- Article
Low-Loss Electron Imaging for Enhanced Surface Detail in the Scanning Electron Microscope: The Contributions of Oliver C. Wells.
- Published in:
- Microscopy Today, 2015, v. 23, n. 1, p. 24, doi. 10.1017/S1551929514001370
- By:
- Publication type:
- Article
Real-Time Scanning Charged-Particle Microscope Image Composition with Correction of Drift.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 2, p. 302, doi. 10.1017/S1431927610094250
- By:
- Publication type:
- Article
Fractional Diffusion, Low Exponent Lévy Stable Laws, and 'Slow Motion' Denoising of Helium Ion Microscope Nanoscale Imagery.
- Published in:
- Journal of Research of the National Institute of Standards & Technology, 2012, v. 117, n. 1, p. 119
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- Publication type:
- Article
Does your SEM really tell the truth? How would you know? Part 2.
- Published in:
- Scanning, 2014, v. 36, n. 3, p. 347, doi. 10.1002/sca.21124
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- Publication type:
- Article
Does your SEM Really tell the truth?-how would you know? Part 1.
- Published in:
- Scanning, 2013, v. 35, n. 6, p. 355, doi. 10.1002/sca.21075
- By:
- Publication type:
- Article
Modeling for accurate dimensional scanning electron microscope metrology: then and now.
- Published in:
- Scanning, 2011, v. 33, n. 3, p. 111, doi. 10.1002/sca.20238
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- Publication type:
- Article
Nanotip electron gun for the scanning electron microscope.
- Published in:
- Scanning, 2006, v. 28, n. 3, p. 133, doi. 10.1002/sca.4950280301
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- Publication type:
- Article
New application of variable-pressure/environmental microscopy to semiconductor inspection and metrology.
- Published in:
- Scanning, 2004, v. 26, n. 1, p. 11, doi. 10.1002/sca.4950260103
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- Publication type:
- Article
Two-dimensional simulation and modeling in scanning electron microscope imaging and metrology research.
- Published in:
- Scanning, 2002, v. 24, n. 4, p. 179, doi. 10.1002/sca.4950240404
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- Publication type:
- Article
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part II- chemically-mechanically planarized samples.
- Published in:
- Scanning, 2001, v. 23, n. 6, p. 366, doi. 10.1002/sca.4950230602
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- Publication type:
- Article
Application of the low-loss scanning electron microscope image to integrated circuit technology. Part 1- applications to accurate dimension measurements.
- Published in:
- Scanning, 2001, v. 23, n. 5, p. 298, doi. 10.1002/sca.4950230502
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- Publication type:
- Article
Image sharpness measurement in the scanning electron microscope-Part III.
- Published in:
- Scanning, 1999, v. 21, n. 4, p. 246, doi. 10.1002/sca.4950210404
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- Publication type:
- Article
Time-lapse scanning electron microscopy for measurement of contamination rate and stage drift.
- Published in:
- Scanning, 1999, v. 21, n. 3, p. 191, doi. 10.1002/sca.4950210304
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- Publication type:
- Article
Digital imaging for scanning electron microscopy.
- Published in:
- Scanning, 1996, v. 18, n. 1, p. 1, doi. 10.1002/sca.1996.4950180101
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- Publication type:
- Article
Is your scanning electron microscope Hi-Fi?
- Published in:
- Scanning, 1995, v. 17, n. 5, p. 287, doi. 10.1002/sca.4950170504
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- Publication type:
- Article