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Probing the surface chemical structure of some novel poly(ortho esters) prepared with N-methyl and N-phenyl ethanolamine by time-of-flight secondary ion mass spectrometry (ToF-SIMS).
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- Polymers for Advanced Technologies, 1992, v. 3, n. 6, p. 293, doi. 10.1002/pat.1992.220030603
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Prospect of increasing secondary ion yields in ToF-SIMS using water cluster primary ion beams.
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- Surface & Interface Analysis: SIA, 2014, v. 46, p. 51, doi. 10.1002/sia.5606
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A systematic evaluation of cytospinning as a novel technique for the preparation of cells for ToF-SIMS analysis.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 290, doi. 10.1002/sia.3413
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A molecular dynamics study of a 5 keV C.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 107, doi. 10.1002/sia.3527
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Exploring subcellular imaging on the buncher-ToF J105 3D chemical imager.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 380, doi. 10.1002/sia.3457
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Classification of adsorbed protein static ToF-SIMS spectra by principal component analysis and neural networks.
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- Surface & Interface Analysis: SIA, 2002, v. 33, n. 9, p. 715, doi. 10.1002/sia.1438
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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of the bleaching of keratin fibres and the application of cationic alkyl protein softeners to bleached cashmere.
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- Surface & Interface Analysis: SIA, 2000, v. 29, n. 7, p. 422, doi. 10.1002/1096-9918(200007)29:7<422::AID-SIA885>3.0.CO;2-2
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SIMS Investigation of Fresh and Aged Automotive Exhaust Catalysts.
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- Surface & Interface Analysis: SIA, 1996, v. 24, n. 10, p. 695, doi. 10.1002/(SICI)1096-9918(19960930)24:10<695::AID-SIA172>3.0.CO;2-0
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Feasibility of quantitative analysis of metals and alloys by non-resonant multiphoton ionization of sputtered neutral species.
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- Surface & Interface Analysis: SIA, 1995, v. 23, n. 9, p. 623, doi. 10.1002/sia.740230908
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Characterization of adhesive and coating constituents by time-of-flight secondary ion mass spectrometry (ToF-SIMS). Part 1: Epoxy-terminated diglycidyl polyethers of bisphenol-A and propal-2-ol.
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- Surface & Interface Analysis: SIA, 1993, v. 20, n. 5, p. 449, doi. 10.1002/sia.740200519
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A tandem SIMS study of poly(vinyl methyl ether).
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- Surface & Interface Analysis: SIA, 1992, v. 18, n. 3, p. 210, doi. 10.1002/sia.740180306
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Application of tandem analyser to SIMS studies of hydrocarbon polymers.
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- Surface & Interface Analysis: SIA, 1991, v. 17, n. 10, p. 737, doi. 10.1002/sia.740171008
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Applications of tandem quadrupole mass spectrometry in SIMS.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 3, doi. 10.1002/sia.740160104
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The preparation and characterization of a model supported ruthenium catalyst.
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- Surface & Interface Analysis: SIA, 1990, v. 16, n. 1-12, p. 359, doi. 10.1002/sia.740160176
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SSIMS, XPS and microstructural studies of ac-phosphoric acid anodic films on aluminium.
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- Surface & Interface Analysis: SIA, 1990, v. 15, n. 6, p. 369, doi. 10.1002/sia.740150605
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Quantitative surface analysis using electron beam SNMS: Calibrations and applications.
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- Surface & Interface Analysis: SIA, 1989, v. 14, n. 6/7, p. 393, doi. 10.1002/sia.740140617
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An XPS and SIMS analysis of biodegradable biomedical polyesters.
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- Surface & Interface Analysis: SIA, 1989, v. 14, n. 3, p. 115, doi. 10.1002/sia.740140304
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Secondary ion mass spectrometry-basic concepts, instrumental aspects, applications and trends. A. BENNINGHOVEN, F. G. RUDENAUER and H. W. WERNER, Wiley, New York, 1987, 1277 pages.
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- Surface & Interface Analysis: SIA, 1987, v. 10, n. 8, p. 435, doi. 10.1002/sia.740100811
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The application of secondary Ion mass spectrometry to surface analysis of semiconductor substrates and devices.
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- Surface & Interface Analysis: SIA, 1986, v. 9, n. 5, p. 309, doi. 10.1002/sia.740090508
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Comparative studies of constrast mechanisms in electron and ion induced secondary electron images.
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- Surface & Interface Analysis: SIA, 1986, v. 9, n. 1, p. 70, doi. 10.1002/sia.740090116
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The relationship between electron and ion induced secondary electron imaging: A review with new experimental observations.
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- Surface & Interface Analysis: SIA, 1986, v. 8, n. 3, p. 93, doi. 10.1002/sia.740080302
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A comparison of positive and negative ion static SIMS spectra of polymer surfaces.
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- Surface & Interface Analysis: SIA, 1986, v. 8, n. 2, p. 75, doi. 10.1002/sia.740080207
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Static SIMS for applied surface analysis.
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- Surface & Interface Analysis: SIA, 1984, v. 6, n. 1, p. 1, doi. 10.1002/sia.740060102
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Secondary ion mass spectrometry, SIMS III, Proceedings of the Third International Conference, Technical University, Budapest, Hungary, 1981. A. Benninghoven, J. Giber, J. Laszlo, M. Riedel and H. W. Werner (Editors). Springer Series in Chemical Physics, Vol. 19. Springer-Verlag, Berlin, FRG, 1982. pp. 444 + xi, 289 Figs. DM 80, US $37.00 (approx)
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- Surface & Interface Analysis: SIA, 1983, v. 5, n. 1, p. IV, doi. 10.1002/sia.740050111
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Fast atom bombardment mass spectrometry for applied surface analysis.
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- Surface & Interface Analysis: SIA, 1982, v. 4, n. 4, p. 160, doi. 10.1002/sia.740040407
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Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system.
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- Journal of Materials Science, 2003, v. 38, n. 10, p. 2171, doi. 10.1023/A:1023728114543
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