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Performance Analysis of AlN/GaN HEMTs on β-Ga<sub>2</sub>O<sub>3</sub> Through Exploration of Varied Back Barriers: An Investigative Study for Advanced RF Power Applications.
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- Journal of Electronic Materials, 2024, v. 53, n. 7, p. 3887, doi. 10.1007/s11664-024-11100-1
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- Article