Works matching AU Veldhuis, Raymond
1
- European Radiology, 2022, v. 32, n. 9, p. 6384, doi. 10.1007/s00330-022-08730-6
- Nagaraj, Yeshaswini;
- de Jonge, Gonda;
- Andreychenko, Anna;
- Presti, Gabriele;
- Fink, Matthias A.;
- Pavlov, Nikolay;
- Quattrocchi, Carlo C.;
- Morozov, Sergey;
- Veldhuis, Raymond;
- Oudkerk, Matthijs;
- van Ooijen, Peter M. A.
- Article
2
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/7886911
- Santemiz, Pinar;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N. J.;
- Vielhauer, Claus
- Article
3
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/3236602
- Arıcan, Tuğçe;
- Veldhuis, Raymond;
- Spreeuwers, Luuk;
- Bergeron, Loïc;
- Busch, Christoph;
- Jalilian, Ehsaneddin;
- Kauba, Christof;
- Kirchgasser, Simon;
- Marcel, Sébastien;
- Prommegger, Bernhard;
- Raja, Kiran;
- Ramachandra, Raghavendra;
- Uhl, Andreas
- Article
4
- IET Biometrics (Wiley-Blackwell), 2024, v. 2024, p. 1, doi. 10.1049/2024/4413655
- Normakristagaluh, Pesigrihastamadya;
- Laanstra, Geert J.;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N. J.
- Article
5
- IET Biometrics (Wiley-Blackwell), 2022, v. 11, n. 5, p. 407, doi. 10.1049/bme2.12082
- Rezgui, Zohra;
- Bassit, Amina;
- Veldhuis, Raymond
- Article
6
- IET Biometrics (Wiley-Blackwell), 2022, v. 11, n. 5, p. 430, doi. 10.1049/bme2.12075
- Bassit, Amina;
- Hahn, Florian;
- Veldhuis, Raymond;
- Peter, Andreas
- Article
7
- IET Biometrics (Wiley-Blackwell), 2022, v. 11, n. 1, p. 79, doi. 10.1049/bme2.12057
- Busch, Christoph;
- Czajka, Adam;
- Deravi, Farzin;
- Drozdowski, Pawel;
- Gomez‐Barrero, Marta;
- Hasse, Georg;
- Henniger, Olaf;
- Kindt, Els;
- Kolberg, Jascha;
- Nouak, Alexander;
- Raja, Kiran;
- Ramachandra, Raghavendra;
- Rathgeb, Christian;
- Salomon, Jean;
- Veldhuis, Raymond
- Article
8
- IET Biometrics (Wiley-Blackwell), 2021, v. 10, n. 6, p. 679, doi. 10.1049/bme2.12036
- Zeng, Dan;
- Veldhuis, Raymond;
- Spreeuwers, Luuk;
- Arendsen, Richard
- Article
9
- IET Biometrics (Wiley-Blackwell), 2021, v. 10, n. 6, p. 581, doi. 10.1049/bme2.12029
- Zeng, Dan;
- Veldhuis, Raymond;
- Spreeuwers, Luuk
- Article
10
- IET Biometrics (Wiley-Blackwell), 2021, v. 10, n. 4, p. 430, doi. 10.1049/bme2.12047
- Batskos, Ilias;
- Wit, Florens F.;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond J.
- Article
11
- IET Biometrics (Wiley-Blackwell), 2019, v. 8, n. 4, p. 277, doi. 10.1049/iet-bmt.2018.5106
- Susyanto, Nanang;
- Veldhuis, Raymond;
- Spreeuwers, Luuk;
- Klaassen, Chris
- Article
12
- IET Biometrics (Wiley-Blackwell), 2019, v. 8, n. 4, p. 267, doi. 10.1049/iet-bmt.2018.5008
- Peng, Yuxi;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N.J.
- Article
13
- IET Biometrics (Wiley-Blackwell), 2018, v. 7, n. 6, p. 606, doi. 10.1049/iet-bmt.2017.0203
- Santemiz, Pinar;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N.J.
- Article
14
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 6, p. 487, doi. 10.1049/iet-bmt.2016.0160
- Zeinstra, Chris G.;
- Veldhuis, Raymond N.J.;
- Spreeuwers, Luuk J.;
- Ruifrok, Arnout C.C.;
- Meuwly, Didier
- Article
15
- IET Biometrics (Wiley-Blackwell), 2017, v. 6, n. 6, p. 418, doi. 10.1049/iet-bmt.2016.0026
- Peng, Yuxi;
- Spreeuwers, Luuk;
- Veldhuis, Raymond
- Article
16
- IET Biometrics (Wiley-Blackwell), 2016, v. 5, n. 2, p. 140, doi. 10.1049/iet-bmt.2015.0036
- van Dam, Chris;
- Veldhuis, Raymond;
- Spreeuwers, Luuk
- Article
17
- IET Biometrics (Wiley-Blackwell), 2015, v. 4, n. 3, p. 137, doi. 10.1049/iet-bmt.2014.0037
- Dutta, Abhishek;
- Günther, Manuel;
- El Shafey, Laurent;
- Marcel, Sébastien;
- Veldhuis, Raymond;
- Spreeuwers, Luuk
- Article
18
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 4, p. 335, doi. 10.1049/iet-bmt.2014.0009
- Ali, Tauseef;
- Spreeuwers, Luuk;
- Veldhuis, Raymond;
- Meuwly, Didier
- Article
19
- IET Biometrics (Wiley-Blackwell), 2014, v. 3, n. 2, p. 94, doi. 10.1049/iet-bmt.2013.0067
- Wang, Ruifang;
- Ramos, Daniel;
- Veldhuis, Raymond;
- Fierrez, Julian;
- Spreeuwers, Luuk;
- Xu, Haiyun
- Article
20
- Medical Physics, 2021, v. 48, n. 2, p. 733, doi. 10.1002/mp.14648
- Zheng, Sunyi;
- Cornelissen, Ludo J.;
- Cui, Xiaonan;
- Jing, Xueping;
- Veldhuis, Raymond N. J.;
- Oudkerk, Matthijs;
- Ooijen, Peter M. A.
- Article
21
- EURASIP Journal on Image & Video Processing, 2024, v. 2024, n. 1, p. 1, doi. 10.1186/s13640-024-00643-2
- Arican, Tugce;
- Veldhuis, Raymond;
- Spreeuwers, Luuk
- Article
22
- Journal of Digital Imaging, 2022, v. 35, n. 3, p. 538, doi. 10.1007/s10278-022-00599-7
- Nagaraj, Yeshaswini;
- Wisselink, Hendrik Joost;
- Rook, Mieneke;
- Cai, Jiali;
- Nagaraj, Sunil Belur;
- Sidorenkov, Grigory;
- Veldhuis, Raymond;
- Oudkerk, Matthijs;
- Vliegenthart, Rozemarijn;
- van Ooijen, Peter
- Article
23
- IET Image Processing (Wiley-Blackwell), 2024, v. 18, n. 12, p. 3570, doi. 10.1049/ipr2.13195
- Zeng, Dan;
- Jiang, Wen;
- Yan, Xiao;
- Fu, Weibao;
- Shen, Qiaomu;
- Veldhuis, Raymond;
- Tang, Bo
- Article
24
- IET Image Processing (Wiley-Blackwell), 2022, v. 16, n. 5, p. 1280, doi. 10.1049/ipr2.12408
- Normakristagaluh, Pesigrihastamadya;
- Laanstra, Geert Jan;
- Spreeuwers, Luuk;
- Veldhuis, Raymond
- Article
25
- IET Image Processing (Wiley-Blackwell), 2019, v. 13, n. 10, p. 1790, doi. 10.1049/iet-ipr.2018.5732
- Zeng, Dan;
- Spreeuwers, Luuk;
- Veldhuis, Raymond;
- Zhao, Qijun
- Article
26
- Machine Learning, 2022, v. 111, n. 12, p. 4411, doi. 10.1007/s10994-022-06266-w
- Atashgahi, Zahra;
- Pieterse, Joost;
- Liu, Shiwei;
- Mocanu, Decebal Constantin;
- Veldhuis, Raymond;
- Pechenizkiy, Mykola
- Article
27
- Machine Learning, 2022, v. 111, n. 1, p. 377, doi. 10.1007/s10994-021-06063-x
- Atashgahi, Zahra;
- Sokar, Ghada;
- van der Lee, Tim;
- Mocanu, Elena;
- Mocanu, Decebal Constantin;
- Veldhuis, Raymond;
- Pechenizkiy, Mykola
- Article
28
- Technologies (2227-7080), 2023, v. 11, n. 4, p. 104, doi. 10.3390/technologies11040104
- Liu, Lu;
- Ma, Runlei;
- van Ooijen, Peter M. A.;
- Oudkerk, Matthijs;
- Vliegenthart, Rozemarijn;
- Veldhuis, Raymond N. J.;
- Brune, Christoph
- Article
29
- International Journal of Information Security, 2010, v. 9, n. 3, p. 193, doi. 10.1007/s10207-010-0103-4
- Buhan, Ileana;
- Doumen, Jeroen;
- Hartel, Pieter;
- Tang, Qian;
- Veldhuis, Raymond
- Article
30
- Journal of Electronic Imaging, 2008, v. 17, n. 1, p. 11017, doi. 10.1117/1.2892675
- Xiaoxin Shang;
- Raymond N. J. Veldhuis
- Article
31
- EURASIP Journal on Information Security, 2022, v. 2022, n. 1, p. 1, doi. 10.1186/s13635-022-00131-y
- Haasnoot, Erwin;
- Spreeuwers, Luuk J.;
- Veldhuis, Raymond N. J.
- Article
32
- Sensors (14248220), 2012, v. 12, n. 5, p. 5246, doi. 10.3390/s120505246
- Bian Yang;
- Busch, Christoph;
- de Groot, Koen;
- Haiyun Xu;
- Veldhuis, Raymond N.J.
- Article
33
- PLoS ONE, 2021, v. 16, n. 10, p. 1, doi. 10.1371/journal.pone.0259036
- Apriyanti, Diah Harnoni;
- Spreeuwers, Luuk J.;
- Lucas, Peter J. F.;
- Veldhuis, Raymond N. J.
- Article