Works by Vattikuti, S. V. Prabhakar


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    Evaluation of temperature dependent electrical transport parameters in Fe<sub>3</sub>O<sub>4</sub>/SiO<sub>2</sub>/n-Si metal–insulator-semiconductor (MIS) type Schottky barrier heterojunction in a wide temperature range.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 9, p. 8955, doi. 10.1007/s10854-019-01223-1
    By:
    • Nanda Kumar Reddy, Nallabala;
    • Godavarthi, Srinivas;
    • Mohan Kumar, Kesarla;
    • Kummara, Venkata Krishnaiah;
    • Prabhakar Vattikuti, S. V.;
    • Akkera, Harish Sharma;
    • Bitla, Yugandhar;
    • Jilani, S. A. K.;
    • Manjunath, V.
    Publication type:
    Article
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