Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography.
- Published in:
- 2019
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- Publication type:
- Abstract
Works matching AU Váńa, Rostislav
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Use of Focused Ion Beam as a Sample Preparation Tool for Cryo-Electron Tomography.
- Published in:
- 2018
- By:
- Publication type:
- Abstract