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Determining the Compositional Profile of HgTe/Cd<sub>x</sub>Hg<sub>1 –</sub> <sub>x</sub>Te Quantum Wells by Single-Wavelength Ellipsometry.
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- Optics & Spectroscopy, 2019, v. 127, n. 2, p. 340, doi. 10.1134/S0030400X19080253
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- Article
Preparation of Atomically Clean and Structurally Ordered Surfaces of Epitaxial CdTe Films for Subsequent Epitaxy.
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- Semiconductors, 2021, v. 55, n. 1, p. S62, doi. 10.1134/S1063782621090220
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- Article