Works matching AU Unger, Wolfgang


Results: 62
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    Plasma Process. Polym. 6/2010.

    Published in:
    Plasma Processes & Polymers, 2010, v. 7, n. 6, p. n/a, doi. 10.1002/ppap.201090012
    By:
    • Girard-Lauriault, Pierre-Luc;
    • Retzko, Iris;
    • Swaraj, Sufal;
    • Matsubayashi, Nobuyuki;
    • Gross, Thomas;
    • Mix, Renate;
    • Unger, Wolfgang E. S.
    Publication type:
    Article
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    Plasma Process. Polym. 7/2008.

    Published in:
    Plasma Processes & Polymers, 2008, v. 5, n. 7, p. n/a, doi. 10.1002/ppap.200890012
    By:
    • Girard-Lauriault, Pierre-Luc;
    • Desjardins, Patrick;
    • Unger, Wolfgang E. S.;
    • Lippitz, Andreas;
    • Wertheimer, Michael R.
    Publication type:
    Article
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    Cover Picture: Plasma Process. Polym. 3/2006.

    Published in:
    Plasma Processes & Polymers, 2006, v. 3, n. 3, p. 265, doi. 10.1002/ppap.200690004
    By:
    • Oran, Umut;
    • Swaraj, Sufal;
    • Lippitz, Andreas;
    • Unger, Wolfgang E. S.
    Publication type:
    Article
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    Surface Analysis of Plasma-Deposited Polymer Films, 4.

    Published in:
    Plasma Processes & Polymers, 2005, v. 2, n. 4, p. 310, doi. 10.1002/ppap.200400070
    By:
    • Swaraj, Sufal;
    • Oran, Umut;
    • Lippitz, Andreas;
    • Schulze, Rolf-Dieter;
    • Friedrich, Joerg F.;
    • Unger, Wolfgang E. S.
    Publication type:
    Article
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    Surface Analysis of Plasma-Deposited Polymer Films, 2.

    Published in:
    Plasma Processes & Polymers, 2004, v. 1, n. 2, p. 134, doi. 10.1002/ppap.200400022
    By:
    • Swaraj, Sufal;
    • Oran, Umut;
    • Lippitz, Andreas;
    • Schulze, Rolf-Dieter;
    • Friedrich, Jörg F.;
    • Unger, Wolfgang E. S.
    Publication type:
    Article
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    Rebranding the Scottish Executive.

    Published in:
    Journal of Language & Politics, 2013, v. 12, n. 1, p. 59, doi. 10.1075/jlp.12.1.03ung
    By:
    • Wolfgang Unger, Johann
    Publication type:
    Article
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    Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS)

    Published in:
    Surface & Interface Analysis: SIA, 2022, v. 54, n. 4, p. 320, doi. 10.1002/sia.7025
    By:
    • Unger, Wolfgang E. S.;
    • Senoner, Mathias;
    • Stockmann, Jörg M.;
    • Fernandez, Vincent;
    • Fairley, Neal;
    • Passiu, Cristiana;
    • Spencer, Nicholas D.;
    • Rossi, Antonella
    Publication type:
    Article
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    Cover Image, Volume 50, Issue 9.

    Published in:
    Surface & Interface Analysis: SIA, 2018, v. 50, n. 9, p. i, doi. 10.1002/sia.6523
    By:
    • Baer, Donald R.;
    • Karakoti, Ajay S.;
    • Clifford, Charles A.;
    • Minelli, Caterina;
    • Unger, Wolfgang E. S.
    Publication type:
    Article