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On the reliability of powder diffraction Line Profile Analysis of plastically deformed nanocrystalline systems.
- Published in:
- Scientific Reports, 2016, p. 20712, doi. 10.1038/srep20712
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- Article
Nanoscale mapping of carrier collection in single nanowire solar cells using X‐ray beam induced current.
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- Journal of Synchrotron Radiation, 2019, v. 26, n. 1, p. 102, doi. 10.1107/S1600577518015229
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- Article
Self-cleaning and surface chemical reactions during hafnium dioxide atomic layer deposition on indium arsenide.
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- Nature Communications, 2018, v. 9, n. 1, p. 1, doi. 10.1038/s41467-018-03855-z
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- Article
Lattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF.
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- 2018
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- Abstract
Lattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF.
- Published in:
- 2018
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- Publication type:
- Abstract
Toward a reference material for line profile analysis.
- Published in:
- Powder Diffraction, 2015, v. 30, p. S47, doi. 10.1017/S0885715614001298
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- Article