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2D Electric field imagery in 4H-SiC power diodes using OBIC technique.
- Published in:
- European Physical Journal - Applied Physics, 2015, v. 72, n. 2, p. 1, doi. 10.1051/epjap/2015150054
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Formation par projet et opportunité d'accès à distance à des ressources pédagogiques.
- Published in:
- J3eA, 2014, v. 13, p. 1, doi. 10.1051/j3ea/2014005
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- Publication type:
- Article