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Characterization of the electronic structure and thermal stability of HfO<sub>2</sub>/SiO<sub>2</sub>/Si gate dielectric stack.
- Published in:
- Surface & Interface Analysis: SIA, 2017, v. 49, n. 8, p. 776, doi. 10.1002/sia.6222
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- Article
Anomalous Ferromagnetism of quasiparticle doped holes in cuprate heterostructures revealed using resonant soft X-ray magnetic scattering.
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- Nature Communications, 2022, v. 13, n. 1, p. 1, doi. 10.1038/s41467-022-31885-1
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- Article
Observation of local lattice tilts in strain-relaxed Si<sub>1-x</sub>Ge<sub>x</sub> using high resolution channeling contrast microscopy.
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- Applied Physics A: Materials Science & Processing, 2005, v. 81, n. 6, p. 1163, doi. 10.1007/s00339-004-3076-1
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- Article
The Investigation of Surface Topography Development in Si(001) and Si(111) During Sims Depth Profiling.
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- Surface Review & Letters, 2001, v. 8, n. 5, p. 453, doi. 10.1142/S0218625X01001233
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- Article
Missing “Sheets” in the Reciprocal Space Representation of the Disordered Surface with One-Dimensional Domain Boundaries.
- Published in:
- Surface Review & Letters, 2001, v. 8, n. 5, p. 509, doi. 10.1142/S0218625X01001300
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- Article