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Wafer Scale Mapping and Statistical Analysis of Radio Frequency Characteristics in Highly Uniform CVD Graphene Transistors.
- Published in:
- Advanced Electronic Materials, 2019, v. 5, n. 4, p. N.PAG, doi. 10.1002/aelm.201800711
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- Article
Black Phosphorus Radio Frequency Electronics at Cryogenic Temperatures.
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- Advanced Electronic Materials, 2018, v. 4, n. 8, p. 1, doi. 10.1002/aelm.201800138
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- Article
Near‐Field Characterization of Graphene Plasmons by Photo‐Induced Force Microscopy.
- Published in:
- Laser & Photonics Reviews, 2018, v. 12, n. 8, p. 1, doi. 10.1002/lpor.201800040
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- Article