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Counterion Influenced Metal‐Organic Frameworks of Cyclam with Cu<sup>II</sup>.
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- ChemistrySelect, 2023, v. 8, n. 29, p. 1, doi. 10.1002/slct.202301810
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Non-destructive Detection of Screw Dislocations and the Corresponding Defects Nucleated from Them During SiC Epitaxial Growth and Their Effect on Device Characteristics.
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- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5099, doi. 10.1007/s11664-018-6414-3
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- Article