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Electrical and Structural Properties of Semi-Polar-ZnO/ a -Al 2 O 3 and Polar-ZnO/ c -Al 2 O 3 Films: A Comparative Study.
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- Materials (1996-1944), 2023, v. 16, n. 1, p. 151, doi. 10.3390/ma16010151
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Structural Properties of Thin ZnO Films Deposited by ALD under O-Rich and Zn-Rich Growth Conditions and Their Relationship with Electrical Parameters.
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- Materials (1996-1944), 2021, v. 14, n. 14, p. 4048, doi. 10.3390/ma14144048
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Cathodoluminescent Imaging of ZnO:N Films: Study of Annealing Processes Leading to Enhanced Acceptor Luminescence.
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- Physica Status Solidi. A: Applications & Materials Science, 2023, v. 220, n. 10, p. 1, doi. 10.1002/pssa.202200466
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Bridgman-Grown (Cd,Mn)Te and (Cd,Mn)(Te,Se): A Comparison of Suitability for X and Gamma Detectors.
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- Sensors (14248220), 2024, v. 24, n. 2, p. 345, doi. 10.3390/s24020345
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