Works by Subjeck, Joeseph

An assessment of Sn whiskers and depleted area formation in thin Sn films using quantitative image analysis.

Published in:

Journal of Materials Science, 2011, v. 46, n. 1, p. 263, doi. 10.1007/s10853-010-4976-4

By:

• Jing Cheng;
• Vianco, Paul T.;
• Subjeck, Joeseph;
• Li, James

Publication type:

Article