Found: 1
Select item for more details and to access through your institution.
A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 77, doi. 10.1007/s10836-017-5643-3
- By:
- Publication type:
- Article