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Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films.
- Published in:
- Optical Engineering, 2022, v. 61, n. 7, p. 71603, doi. 10.1117/1.OE.61.7.071603
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Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films.
- Published in:
- Optical Engineering, 2022, v. 61, n. 7, p. 70903, doi. 10.1117/1.OE.61.7.070903
- By:
- Publication type:
- Article