Found: 5

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  • NanoMAX: the hard X‐ray nanoprobe beamline at the MAX IV Laboratory.

    Published in:
    Journal of Synchrotron Radiation, 2021, v. 28, n. 6, p. 1935, doi. 10.1107/S1600577521008213
    By:
    • Johansson, Ulf;
    • Carbone, Dina;
    • Kalbfleisch, Sebastian;
    • Björling, Alexander;
    • Kahnt, Maik;
    • Sala, Simone;
    • Stankevic, Tomas;
    • Liebi, Marianne;
    • Rodriguez Fernandez, Angel;
    • Bring, Björn;
    • Paterson, David;
    • Thånell, Karina;
    • Bell, Paul;
    • Erb, David;
    • Weninger, Clemens;
    • Matej, Zdenek;
    • Roslund, Linus;
    • Åhnberg, Karl;
    • Norsk Jensen, Brian;
    • Tarawneh, Hamed
    Publication type:
    Article

  • Design and performance of a dedicated coherent X-ray scanning diffraction instrument at beamline NanoMAX of MAX IV.

    Published in:
    Journal of Synchrotron Radiation, 2022, v. 29, n. 3, p. 876, doi. 10.1107/S1600577522001333
    By:
    • Carbone, Dina;
    • Kalbfleisch, Sebastian;
    • Johansson, Ulf;
    • Björling, Alexander;
    • Kahnt, Maik;
    • Sala, Simone;
    • Stankevic, Tomas;
    • Rodriguez-Fernandez, Angel;
    • Bring, Björn;
    • Matej, Zdenek;
    • Bell, Paul;
    • Erb, David;
    • Hardion, Vincent;
    • Weninger, Clemens;
    • Al-Sallami, Hussein;
    • Lidon-Simon, Julio;
    • Carlson, Stefan;
    • Jerrebo, Annika;
    • Jensen, Brian Norsk;
    • Bjermo, Anders
    Publication type:
    Article

  • Lattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF.

    Published in:
    2018
    By:
    • Zhou, Tao;
    • Stankevic, Tomas;
    • Troian, Andrea;
    • Ren, Zhe;
    • Bi, Zhaoxia;
    • Ohlsson, Jonas;
    • Samuelson, Lars;
    • Hilhorst, Jan;
    • Schulli, Tobias;
    • Mikkelsen, Anders;
    • Balmes, Olivier
    Publication type:
    Abstract

  • Lattice Tilt Mapping using Full Field Diffraction X-Ray Microscopy at ID01 ESRF.

    Published in:
    2018
    By:
    • Zhou, Tao;
    • Stankevic, Tomas;
    • Troian, Andrea;
    • Ren, Zhe;
    • Bi, Zhaoxia;
    • Ohlsson, Jonas;
    • Samuelson, Lars;
    • Hilhorst, Jan;
    • Schulli, Tobias;
    • Mikkelsen, Anders;
    • Balmes, Olivier
    Publication type:
    Abstract

  • Measurement of strain in InGaN/GaN nanowires and nanopyramids.

    Published in:
    Journal of Applied Crystallography, 2015, v. 48, n. 2, p. 344, doi. 10.1107/S1600576715000965
    By:
    • Stankevič, Tomaš;
    • Mickevičius, Simas;
    • Schou Nielsen, Mikkel;
    • Kryliouk, Olga;
    • Ciechonski, Rafal;
    • Vescovi, Giuliano;
    • Bi, Zhaoxia;
    • Mikkelsen, Anders;
    • Samuelson, Lars;
    • Gundlach, Carsten;
    • Feidenhans'l, Robert
    Publication type:
    Article