Found: 7
Select item for more details and to access through your institution.
Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 63, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P
- By:
- Publication type:
- Article
IN SITU FAILURE DETECTION IN THICK FILM MULTILAYER SYSTEMS.
- Published in:
- Quality & Reliability Engineering International, 1995, v. 11, n. 4, p. 307, doi. 10.1002/qre.4680110416
- By:
- Publication type:
- Article
THE USE OF EARLY RESISTANCE AND EARLY TCR CHANGES TO PREDICT THE RELIABILITY OF ON-CHIP INTERCONNECTS.
- Published in:
- Quality & Reliability Engineering International, 1994, v. 10, n. 4, p. 309, doi. 10.1002/qre.4680100410
- By:
- Publication type:
- Article
A model for thin film texture evolution driven by surface energy effects.
- Published in:
- Physica Status Solidi (B), 1996, v. 195, n. 1, p. 179, doi. 10.1002/pssb.2221950121
- By:
- Publication type:
- Article
Effective Valence of Some E.C.C. Metals from Phonon Data.
- Published in:
- Physica Status Solidi (B), 1980, v. 99, n. 1, p. K61, doi. 10.1002/pssb.2220990159
- By:
- Publication type:
- Article
The Na Vacancy Formation Energy Value from Phonon Data.
- Published in:
- Physica Status Solidi (B), 1979, v. 93, n. 1, p. K9, doi. 10.1002/pssb.2220930155
- By:
- Publication type:
- Article
A diffusion model of metal surface modification during plasma nitriding.
- Published in:
- Applied Physics A: Materials Science & Processing, 1996, v. 63, n. 5, p. 475, doi. 10.1007/BF01571677
- By:
- Publication type:
- Article