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Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs.
- Published in:
- Symmetry (20738994), 2019, v. 11, n. 6, p. 793, doi. 10.3390/sym11060793
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- Article
Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits.
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- Electronics (2079-9292), 2023, v. 12, n. 24, p. 4978, doi. 10.3390/electronics12244978
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- Article
TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials.
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- Electronics (2079-9292), 2022, v. 11, n. 13, p. N.PAG, doi. 10.3390/electronics11132043
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- Article
Detection of financial bubbles using a log-periodic power law singularity (LPPLS) model.
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- WIREs: Computational Statistics, 2024, v. 16, n. 2, p. 1, doi. 10.1002/wics.1649
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- Article
The Effect of Gefitinib on Treatment Necessity and Prognosis of NSCLC Patients with Early EGFR Mutations.
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- Contrast Media & Molecular Imaging, 2022, p. 1, doi. 10.1155/2022/2228744
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- Article
The 2021 Bitcoin Bubbles and Crashes--Detection and Classi?cation.
- Published in:
- Stats, 2021, v. 4, n. 4, p. 950, doi. 10.3390/stats4040056
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- Article