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Quantitative analysis of the surface composition of mixed self-assembled monolayers using ToF-SIMS and FT-IR analyses.
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- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 397, doi. 10.1002/sia.3538
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ToF-SIMS imaging and spectroscopic analyses of PEG-conjugated AuNPs.
- Published in:
- Surface & Interface Analysis: SIA, 2011, v. 43, n. 1/2, p. 628, doi. 10.1002/sia.3508
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- Publication type:
- Article