Works by Soin, N.

Results: 9

Optimizing CNTFET design parameters using the Taguchi method for high-performance and low-power applications.

Published in:

Journal of Engineering Research (2307-1877), 2023, v. 11, n. 2B, p. 138, doi. 10.36909/jer.14155

By:

Abdul Hadi, M. F.;
Hussin, H.;
Soin, N.

Publication type:

Article

Influence of Design and Process Parameters of 32-nm Advanced-Process High- k p-MOSFETs on Negative-Bias Temperature Instability and Study of Defects.

Published in:

Journal of Electronic Materials, 2017, v. 46, n. 10, p. 5942, doi. 10.1007/s11664-017-5575-9

By:

Alimin, A.;
Radzi, A.;
Sazali, N.;
Hatta, S.;
Soin, N.;
Hussin, H.

Publication type:

Article

Work Function Tuning and Doping Optimization of 22-nm HKMG Raised SiGe/SiC Source-Drain FinFETs.

Published in:

Journal of Electronic Materials, 2017, v. 46, n. 3, p. 1567, doi. 10.1007/s11664-016-5199-5

By:

Rezali, F.;
Rasid, M.;
Othman, N.;
Hatta, S.;
Soin, N.

Publication type:

Article

New Simulation Method to Characterize the Recoverable Component of Dynamic Negative-Bias Temperature Instability in p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors.

Published in:

Journal of Electronic Materials, 2014, v. 43, n. 4, p. 1207, doi. 10.1007/s11664-014-2978-8

By:

Hussin, H.;
Soin, N.;
Bukhori, M.F.;
Abdul Wahab, Y.;
Shahabuddin, S.

Publication type:

Article

Multifunctional nanocomposites of poly(vinylidene fluoride) reinforced by carbon nanotubes and magnetite nanoparticles.

Published in:

Express Polymer Letters, 2015, v. 9, n. 12, p. 1104, doi. 10.3144/expresspolymlett.2015.99

By:

Tsonos, C.;
Pandis, C.;
Soin, N.;
Sakellari, D.;
Myrovali, E.;
Kripotou, S.;
Kanapitsas, A.;
Siores, E.

Publication type:

Article

Effects of gate stack structural and process defectivity on high-k dielectric dependence of NBTI reliability in 32 nm technology node PMOSFETs.

Published in:

2014

By:

Hussin, H;
Soin, N;
Bukhori, M F;
Wan Muhamad Hatta, S;
Abdul Wahab, Y;
Hatta, S Wan Muhamad;
Wahab, Y Abdul

Publication type:

journal article

Effects of Gate Stack Structural and Process Defectivity on High-κ Dielectric Dependence of NBTI Reliability in 32 nm Technology Node PMOSFETs.

Published in:

Scientific World Journal, 2014, p. 1, doi. 10.1155/2014/490829

By:

Hussin, H.;
Soin, N.;
Bukhori, M. F.;
Hatta, S. Wan Muhamad;
Wahab, Y. Abdul

Publication type:

Article

Excitation energy dependence of Raman bands in multiwalled carbon nanotubes.

Published in:

Journal of Raman Spectroscopy, 2010, v. 41, n. 10, p. 1227, doi. 10.1002/jrs.2594

By:

Soin, N.;
Roy, S. S.;
Ray, S. C.;
McLaughlin, J. A.

Publication type:

Article

Synthesis and surface engineering of nanomaterials by atmospheric-pressure microplasmas.

Published in:

European Physical Journal - Applied Physics, 2011, v. 56, n. 2, p. N.PAG, doi. 10.1051/epjap/2011110203

By:

McKenna, J.;
Patel, J.;
Mitra, S.;
Soin, N.;
Švrček, V.;
Maguire, P.;
Mariotti, D.

Publication type:

Article