Works matching AU Singh, Vikash K.


Results: 18
    1

    Microstructural Characterization of GaN Grown on SiC.

    Published in:
    Microscopy & Microanalysis, 2019, v. 25, n. 6, p. 1383, doi. 10.1017/S1431927619014739
    By:
    • Saha, Sabyasachi;
    • Kumar, Deepak;
    • Sharma, Chandan K.;
    • Singh, Vikash K.;
    • Channagiri, Samartha;
    • Sridhara Rao, Duggi V.
    Publication type:
    Article
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    Suitability of thin-GaN for AlGaN/GaN HEMT material and device.

    Published in:
    Journal of Materials Science, 2022, v. 57, n. 10, p. 5913, doi. 10.1007/s10853-022-07017-x
    By:
    • Narang, Kapil;
    • Singh, Vikash K.;
    • Pandey, Akhilesh;
    • Khan, Ruby;
    • Bag, Rajesh K.;
    • Rawal, D. S.;
    • Padmavati, M. V. G.;
    • Tyagi, Renu;
    • Singh, Rajendra
    Publication type:
    Article
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