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Impact of Residual Stress on a Polysilicon Channel in Scaled 3D NAND Flash Memory.
- Published in:
- Electronics (2079-9292), 2021, v. 10, n. 21, p. 2632, doi. 10.3390/electronics10212632
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- Article
Finite Element Simulation of the Flat Crush Behavior of Corrugated Packages.
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- Applied Sciences (2076-3417), 2021, v. 11, n. 17, p. 7867, doi. 10.3390/app11177867
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- Article
Hydrogen gaseous effects on fracture resistance of API-X70 estimated by XFEM.
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- Journal of Mechanical Science & Technology, 2021, v. 35, n. 9, p. 3829, doi. 10.1007/s12206-021-2106-7
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- Article
Gate All around with Back Gate NAND Flash Structure for Excellent Reliability Characteristics in Program Operation.
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- Electronics (2079-9292), 2021, v. 10, n. 15, p. 1828, doi. 10.3390/electronics10151828
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- Article
A New Read Scheme for Alleviating Cell-to-Cell Interference in Scaled-Down 3D NAND Flash Memory.
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- Electronics (2079-9292), 2020, v. 9, n. 11, p. 1775, doi. 10.3390/electronics9111775
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- Article
Crack growth evaluation by XFEM for nuclear pipes considering thermal aging embrittlement effect.
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- Fatigue & Fracture of Engineering Materials & Structures, 2019, v. 42, n. 4, p. 775, doi. 10.1111/ffe.12961
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- Article