New scan compression approach to reduce the test data volume.
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- IET Computers & Digital Techniques (Wiley-Blackwell), 2021, v. 15, n. 4, p. 251, doi. 10.1049/cdt2.12020
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Works matching AU Shantagiri, Pralhadrao V.
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Handling Unknown with Blend of Scan and Scan Compression.
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- Journal of Electronic Testing, 2018, v. 34, n. 2, p. 135, doi. 10.1007/s10836-018-5717-x
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Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach.
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- Journal of Low Power Electronics & Applications, 2019, v. 9, n. 2, p. 18, doi. 10.3390/jlpea9020018
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